Published 2007
| Version v1
Journal article
Structural characterization of II-VI semiconductor nanoparticles
Creators
- 1. Wuerzburg Univ. (Germany). Inst. fuer Mineralogie
- 2. Wuerzburg Univ. (Germany). Lehrstuhl fuer Silicatchemie
- 3. Wuerzburg Univ. (Germany). Physikalisches Inst.
Description
We present structure analysis techniques for nanoparticles, which use the explicit simulation of the nanoparticle structure. Data are based on X-ray powder data, which are interpreted via the Debye equation and pair distribution function data. The techniques allow the exact determination of the nanoparticle structure, shape and defect structure. ZnO and ZnSe nanoparticles are of ellipsoidal shape with interatomic distance distribution equal to bulk phases. CdSe/ZnS forms core shell particles in which the ZnS shell is structurally incoherent to the core phase. All three materials are characterized by unusually high stacking fault density. (copyright 2007 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim) (orig.)
Availability note (English)
Available from: http://dx.doi.org/10.1002/pssc.200775409Additional details
Identifiers
Publishing Information
- Journal Title
- Physica Status Solidi. C, Conferences
- Journal Volume
- 4
- Journal Issue
- 9
- Series
- II-IV semiconductors: growth mechanisms, low-dimensional structures, and interfaces
- Journal Page Range
- p. 3221-3233
- ISSN
- 1610-1634
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 38091253
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CADMIUM SELENIDES; COMPUTERIZED SIMULATION; DEBYE-SCHERRER METHOD; DISTRIBUTION FUNCTIONS; FCC LATTICES; INTERATOMIC DISTANCES; LATTICE PARAMETERS; NANOSTRUCTURES; PARTICLE SIZE; PARTICLES; SEMICONDUCTOR MATERIALS; SHAPE; STACKING FAULTS; X-RAY DIFFRACTION; ZINC OXIDES; ZINC SELENIDES
- Descriptors DEC
- CADMIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CUBIC LATTICES; DIFFRACTION; DIFFRACTION METHODS; DISTANCE; FUNCTIONS; MATERIALS; OXIDES; OXYGEN COMPOUNDS; SCATTERING; SELENIDES; SELENIUM COMPOUNDS; SIMULATION; SIZE; ZINC COMPOUNDS
Optional Information
- Notes
- With 7 figs., 1 tab., 24 refs.. SICI: 1610-1634(200709)4:9<3221::AID-PSSC200775409>3.0.TX;2-V