Published January 2006
| Version v1
Journal article
Shape modifications of self-organised colloidal silica nanomasks on silicon
Creators
- 1. University of Augsburg, Institute of Physics, Universitatsstrasse 1, D-86135 Augsburg (Germany)
Description
Regular stencil-type nanomasks with mask openings in the 60 nm range were fabricated on Si(1 0 0) by self-assembly from a colloidal suspension of silica spheres in water. Masks were irradiated with high doses of keV C+ ions at different implantation conditions. SEM and cross-sectional TEM investigations show strong changes of the mask geometry due to both a collective motion of spheres and the formation of pronounced menisci at the contact points of spheres. Results are interpreted in terms of sputter surface erosion superimposed with ion beam induced viscous flow, acting towards a surface minimisation
Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2005.08.067;
- PII
- S0168-583X(05)01497-7;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 242
- Journal Issue
- 1-2
- Journal Page Range
- p. 167-169
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 14. international conference on ion beam modification of materials
- Dates
- 5-10 Sep 2004
- Place
- Pacific Grove, CA (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37068409
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CARBON IONS; EROSION; FABRICATION; ION BEAMS; IRRADIATION; KEV RANGE; MODIFICATIONS; NANOSTRUCTURES; OPENINGS; SCANNING ELECTRON MICROSCOPY; SHAPE; SILICA; SILICON; SPHERES; SURFACES; SUSPENSIONS; TRANSMISSION ELECTRON MICROSCOPY; VISCOUS FLOW; WATER
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; DISPERSIONS; ELECTRON MICROSCOPY; ELEMENTS; ENERGY RANGE; FLUID FLOW; HYDROGEN COMPOUNDS; IONS; MICROSCOPY; MINERALS; OXIDE MINERALS; OXYGEN COMPOUNDS; SEMIMETALS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.