Published December 30, 2011 | Version v1
Journal article

Changes in electrical and optical properties of polycrystalline Ga-doped ZnO thin films due to thermal desorption of zinc

Description

Influences of thermal desorption of Zn atoms on electrical and optical properties of Ga-doped ZnO (GZO) films deposited by ion plating with direct current arc discharge have been studied. The amount of Zn desorption was controlled by thermal desorption spectroscopy. The resistivity of the GZO films was not affected by the thermal desorption of Zn up to the heating temperature of 300 °C, however, the carrier concentration and the Hall mobility showed remarkable changes. The carrier concentrations decreased with increasing the Zn desorption, and the Hall mobility increased. The decrease in carrier concentration showed strong correlation with the desorption of Zn atoms from the GZO films. The transparency in near infrared wavelength region increased without change of resistivity due to the decrease in carrier concentration.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2011.10.039

Additional details

Identifiers

DOI
10.1016/j.tsf.2011.10.039;
PII
S0040-6090(11)01779-2;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
520
Journal Issue
5
Journal Page Range
p. 1407-1410
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
38. international conference on metallurgical coatings and thin films
Acronym
ICMCTF 2011
Dates
27 Apr - 2 May 2011
Place
San Diego, CA (United States)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43108585
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DESORPTION; DOPED MATERIALS; OPACITY; THIN FILMS; ZINC; ZINC OXIDES
Descriptors DEC
CHALCOGENIDES; ELEMENTS; FILMS; MATERIALS; METALS; OPTICAL PROPERTIES; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SORPTION; ZINC COMPOUNDS

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.