Changes in electrical and optical properties of polycrystalline Ga-doped ZnO thin films due to thermal desorption of zinc
Description
Influences of thermal desorption of Zn atoms on electrical and optical properties of Ga-doped ZnO (GZO) films deposited by ion plating with direct current arc discharge have been studied. The amount of Zn desorption was controlled by thermal desorption spectroscopy. The resistivity of the GZO films was not affected by the thermal desorption of Zn up to the heating temperature of 300 °C, however, the carrier concentration and the Hall mobility showed remarkable changes. The carrier concentrations decreased with increasing the Zn desorption, and the Hall mobility increased. The decrease in carrier concentration showed strong correlation with the desorption of Zn atoms from the GZO films. The transparency in near infrared wavelength region increased without change of resistivity due to the decrease in carrier concentration.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2011.10.039Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2011.10.039;
- PII
- S0040-6090(11)01779-2;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 520
- Journal Issue
- 5
- Journal Page Range
- p. 1407-1410
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- 38. international conference on metallurgical coatings and thin films
- Acronym
- ICMCTF 2011
- Dates
- 27 Apr - 2 May 2011
- Place
- San Diego, CA (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43108585
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DESORPTION; DOPED MATERIALS; OPACITY; THIN FILMS; ZINC; ZINC OXIDES
- Descriptors DEC
- CHALCOGENIDES; ELEMENTS; FILMS; MATERIALS; METALS; OPTICAL PROPERTIES; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SORPTION; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.