Irradiation-induced changes in the local environment of Si and Al in LnSiAlON glasses as probed by 27Al and 29Si NMR
- 1. Univ Rennes 1, CNRS, FRE 2717, LARMAUR, F-35042 Rennes (France)
- 2. Univ Rennes 1, Inst Chem, UMR 6512, CNRS, F-35042 Rennes (France)
- 3. CE Cadarache, DEC/SESC, F-13018 St Paul Les Durance (France)
Description
Two compounds have been studied: an oxide glass from the Y-Si-Al-O system and an oxynitride glass from the Y-Si-Al-O-N system, both bombarded with Sn-ions (975 MeV, fluences ranging from 1012 to 2.7 * 1013 Sn/cm2). The changes in the environment of the silicon and the aluminium were investigated using NMR spectroscopy. Irradiation by Sn ions leads to a loss of nitrogen in the silicon and probably the aluminium environments. Part of the aluminium changes from a network former coordination to a network modifier coordination while the oxide silicate network exhibits a higher cross-linking due to an increase of the population of bridging oxygen. Part of the aluminium in five-fold coordination is formed at the expense of aluminium in six-fold coordination in the case of the oxynitride glass and the changes in the silicon environment occur at lower fluences than for the oxide glass. (authors)
Availability note (English)
Available from doi:Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Non-Crystalline Solids
- Journal Volume
- 353
- Journal Issue
- no.4
- Journal Page Range
- p. 390-397
- ISSN
- 0022-3093
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- France
- INIS RN
- 39096254
- Subject category
- S36: MATERIALS SCIENCE; S12: MANAGEMENT OF RADIOACTIVE WASTES, AND NON-RADIOACTIVE WASTES FROM NUCLEAR FACILITIES;
- Descriptors DEI
- ALUMINIUM 27; CROSS-LINKING; GLASS; HARDNESS; HEAVY IONS; NEUTRON DIFFRACTION; NITROGEN; NUCLEAR MAGNETIC RESONANCE; PHYSICAL RADIATION EFFECTS; SCANNING ELECTRON MICROSCOPY; SILICON 29; X-RAY DIFFRACTION
- Descriptors DEC
- ALUMINIUM ISOTOPES; CHARGED PARTICLES; CHEMICAL REACTIONS; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; EVEN-ODD NUCLEI; IONS; ISOTOPES; LIGHT NUCLEI; MAGNETIC RESONANCE; MECHANICAL PROPERTIES; MICROSCOPY; NONMETALS; NUCLEI; ODD-EVEN NUCLEI; POLYMERIZATION; RADIATION EFFECTS; RESONANCE; SCATTERING; SILICON ISOTOPES; STABLE ISOTOPES
Optional Information
- Notes
- 37 refs.