OH molecule-involved formation of point defects in monolayer graphene
- 1. School of Materials Science and Engineering, Gyeongsang National University, Jinju 52828 (Korea, Republic of)
- 2. Department of Materials Science and Engineering and Research Institute of Advanced Materials (RIAM), Seoul National University, Seoul 08826 (Korea, Republic of)
- 3. Center for Multidimensional Carbon Materials, Institute for Basic Science (IBS), Ulsan 44919 (Korea, Republic of)
Description
Point defects in freestanding graphene monolayers such as monovacancies (MVs) and divacancies have been investigated at atomic scale with aberration-corrected transmission electron microscopy and theoretical calculations. In general, these defects can be formed simply by the absence of individual carbon atoms and carbon bond reconstructions in the graphene lattice under electron and ion irradiation. However, in this study, we found that oxygen and hydrogen atoms can be involved in the formation of these point defects caused by the simultaneous detachment of oxygen–carbon atoms. Here we report the effect of the oxygen and hydrogen atoms on the graphene surface forming the point defects under electron beam irradiation, and their role of stabilizing other MVs when composed of 13–5 ring pairs. In addition, theoretical analysis using density functional theory calculations demonstrates that the participating atoms can form the point defects in the intermediate states and stabilize 13–5 ring pairs under electron beam irradiation. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-6528/abb9d7Additional details
Identifiers
Publishing Information
- Journal Title
- Nanotechnology (Print)
- Journal Volume
- 32
- Journal Issue
- 2
- Journal Page Range
- [10 p.]
- ISSN
- 0957-4484
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53071294
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- DEFECTS; DENSITY FUNCTIONAL METHOD; ELECTRON BEAMS; GRAPHENE; HYDROGEN; INTERMEDIATE STATE; IRRADIATION; OXYGEN; POINT DEFECTS; SURFACES; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- BEAMS; CALCULATION METHODS; CARBON; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; ELEMENTS; LEPTON BEAMS; MICROSCOPY; NONMETALS; PARTICLE BEAMS; VARIATIONAL METHODS