Superconducting High-Resolution X-Ray Spectrometers For Chemical State Analysis Of Dilute Samples
Creators
- 1. Department of Applied Science, University of California, Davis, CA, 95616 (United States)
- 2. Advanced Detector Group, Lawrence Livermore National Laboratory, L-270, Livermore, CA 94550 (United States)
- 3. Physics Biosciences Division, Lawrence Berkeley National Laboratory, MS 6-2100, Berkeley, CA 94720 (United States)
Description
Cryogenic X-ray spectrometers operating at temperatures below 1 K combine high energy resolution with broadband efficiency for X-ray energies up to 10 keV. They offer advantages for chemical state analysis of dilute samples by fluorescence-detected X-ray absorption spectroscopy (XAS) in cases where conventional Ge or Si(Li) detectors lack energy resolution and grating spectrometers lack detection efficiency. We are developing soft X-ray spectrometers based on superconducting Nb-Al-AlOx-Al-Nb tunnel junction (STJ) technology. X-rays absorbed in one of the superconducting electrodes generate excess charge carriers in proportion to their energy, thereby producing a measurable temporary increase in tunneling current. For STJ operation at the synchrotron, we have designed a two-stage adiabatic demagnetization refrigerator (ADR) with a cold finger that holds a 3 x 3 array of STJs inside the UHV sample chamber at a temperature of ∼0.1 K within ∼15 mm of a room temperature sample. Our STJ spectrometer can have an energy resolution below 10 eV FWHM for X-ray energies up to 1 keV, and has total count rate capabilities above 100,000 counts/s. We will describe detector performance in synchrotron-based X-ray fluorescence experiments and demonstrate its use for XAS on a dilute metal site in a metalloprotein
Additional details
Identifiers
- DOI
- 10.1063/1.1757962;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 705
- Journal Issue
- 1
- Journal Page Range
- p. 985-988
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 8. international conference on synchrotron radiation instrumentation
- Dates
- 25-29 Aug 2003
- Place
- San Francisco, CA (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36092708
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; ADIABATIC DEMAGNETIZATION; ALUMINIUM OXIDES; CHARGE CARRIERS; CHEMICAL STATE; COUNTING RATES; EFFICIENCY; ELECTRODES; ENERGY RESOLUTION; EV RANGE 01-10; FLUORESCENCE; FLUORESCENCE SPECTROSCOPY; KEV RANGE 01-10; LI-DRIFTED SI DETECTORS; NIOBIUM COMPOUNDS; PERFORMANCE; REFRIGERATORS; SOFT X RADIATION; SUPERCONDUCTING DEVICES; SUPERCONDUCTING JUNCTIONS; SYNCHROTRON RADIATION; SYNCHROTRONS; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0000-0013 K; TEMPERATURE RANGE 0273-0400 K; TUNNEL EFFECT; X-RAY SPECTRA; X-RAY SPECTROMETERS; X-RAY SPECTROSCOPY
- Descriptors DEC
- ACCELERATORS; ALUMINIUM COMPOUNDS; BREMSSTRAHLUNG; CHALCOGENIDES; CYCLIC ACCELERATORS; DEMAGNETIZATION; ELECTROMAGNETIC RADIATION; EMISSION; EMISSION SPECTROSCOPY; ENERGY RANGE; EV RANGE; IONIZING RADIATIONS; KEV RANGE; LI-DRIFTED DETECTORS; LUMINESCENCE; MEASURING INSTRUMENTS; OXIDES; OXYGEN COMPOUNDS; PHOTON EMISSION; RADIATION DETECTORS; RADIATIONS; REFRACTORY METAL COMPOUNDS; RESOLUTION; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; SPECTRA; SPECTROMETERS; SPECTROSCOPY; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS; X RADIATION
Optional Information
- Notes
- (c) 2004 American Institute of Physics