Published May 12, 2004 | Version v1
Journal article

Superconducting High-Resolution X-Ray Spectrometers For Chemical State Analysis Of Dilute Samples

  • 1. Department of Applied Science, University of California, Davis, CA, 95616 (United States)
  • 2. Advanced Detector Group, Lawrence Livermore National Laboratory, L-270, Livermore, CA 94550 (United States)
  • 3. Physics Biosciences Division, Lawrence Berkeley National Laboratory, MS 6-2100, Berkeley, CA 94720 (United States)

Description

Cryogenic X-ray spectrometers operating at temperatures below 1 K combine high energy resolution with broadband efficiency for X-ray energies up to 10 keV. They offer advantages for chemical state analysis of dilute samples by fluorescence-detected X-ray absorption spectroscopy (XAS) in cases where conventional Ge or Si(Li) detectors lack energy resolution and grating spectrometers lack detection efficiency. We are developing soft X-ray spectrometers based on superconducting Nb-Al-AlOx-Al-Nb tunnel junction (STJ) technology. X-rays absorbed in one of the superconducting electrodes generate excess charge carriers in proportion to their energy, thereby producing a measurable temporary increase in tunneling current. For STJ operation at the synchrotron, we have designed a two-stage adiabatic demagnetization refrigerator (ADR) with a cold finger that holds a 3 x 3 array of STJs inside the UHV sample chamber at a temperature of ∼0.1 K within ∼15 mm of a room temperature sample. Our STJ spectrometer can have an energy resolution below 10 eV FWHM for X-ray energies up to 1 keV, and has total count rate capabilities above 100,000 counts/s. We will describe detector performance in synchrotron-based X-ray fluorescence experiments and demonstrate its use for XAS on a dilute metal site in a metalloprotein

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
705
Journal Issue
1
Journal Page Range
p. 985-988
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
8. international conference on synchrotron radiation instrumentation
Dates
25-29 Aug 2003
Place
San Francisco, CA (United States)

Optional Information

Notes
(c) 2004 American Institute of Physics