Published December 1998
| Version v1
Journal article
SEU induced errors observed in microprocessor systems
Creators
- 1. Univ. of Surrey, Guildford (United Kingdom). Surrey Space Centre
- 2. TIMA Lab., Grenoble (France)
- 3. Centre National d'Etudes Spatiales, Toulouse (France)
Description
In this paper, the authors present software tools for predicting the rate and nature of observable SEU induced errors in microprocessor systems. These tools are built around a commercial microprocessor simulator and are used to analyze real satellite application systems. Results obtained from simulating the nature of SEU induced errors are shown to correlate with ground-based radiation test data
Additional details
Publishing Information
- Journal Title
- IEEE Transactions on Nuclear Science
- Journal Volume
- 45
- Journal Issue
- 6Pt1
- Journal Page Range
- p. 2876-2883
- ISSN
- 0018-9499
- CODEN
- IETNAE
Conference
- Title
- IEEE nuclear and space radiation effects conference
- Dates
- 20-24 Jul 1998
- Place
- Newport Beach, CA (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 30034849
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COMPUTER CODES; COMPUTERIZED SIMULATION; ERRORS; MICROPROCESSORS; PHYSICAL RADIATION EFFECTS; SPACE FLIGHT
- Descriptors DEC
- ELECTRONIC CIRCUITS; MICROELECTRONIC CIRCUITS; RADIATION EFFECTS; SIMULATION
Optional Information
- Secondary number(s)
- CONF-980705--