Published December 15, 2009 | Version v1
Journal article

Characterization of II-VI: 3d crystals with the help of ultrasonic technique

  • 1. Russian State Vocational Pedagogical University, 11, Mashinistroiteley st., Ekaterinburg 620012 (Russian Federation)
  • 2. Ural State Technical University, 19, Mira st., Ekaterinburg 620002 (Russian Federation)
  • 3. Institute for Metal Physics, Ural Department of the Russian Academy of Sciences, 18, Sofia Kovalevskay st., Ekaterinburg 620041 (Russian Federation)
  • 4. P.N. Lebedev Physical Institute of the Russian Academy of Sciences, 53, Leninskiy pr., Moscow 119991 (Russian Federation)
  • 5. Institute of Solid State Chemistry, Ural Department of the Russian Academy of Sciences, 91, Pervomaiskay st., Ekaterinburg 620041 (Russian Federation)

Description

The temperature dependence of ultrasonic attenuation is proposed to use for determining concentration of dopand in a diluted magnetic semiconductor. This non-destructive method can be used for the crystal in which attenuation is caused by relaxation in the Jahn-Teller system. Attenuation coefficient per the impurity ion β obtained at a fixed frequency was introduced as a parameter characterizing sensitivity of the method. This parameter was determined for a number of II-VI: 3d semiconductors: ZnSe:Ni2+, ZnTe:Ni2+, ZnSe:V2+, ZnSe:Cr2+, and ZnSe:Fe2+ at 54 MHz. Anomalously large value of β=23x10-18 dB cm2 was found for Cr2+ in ZnSe.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physb.2009.08.284

Additional details

Identifiers

DOI
10.1016/j.physb.2009.08.284;
PII
S0921-4526(09)01057-6;

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
404
Journal Issue
23-24
Journal Page Range
p. 5244-5246
ISSN
0921-4526
CODEN
PHYBE3

Conference

Title
25. international conference on defects in semiconductors
Dates
20-24 Jul 2009
Place
St. Petersburg (Russian Federation)

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.