Fabrication of monodispersed α-Fe2O3@SiO2 core-shell nanospheres and investigation of their dielectric behavior
- 1. Department of Physics, Sacred Heart College (Autonomous), Tirupattur, Tamilnadu (India)
Description
We report dielectric behavior of uniformly dispersed α-Fe2O3@SiO2 core-shell nanospheres prepared by employing solvothermal technique. The α-Fe2O3@SiO2 core-shell nanospheres were subjected to Fourier transform infrared spectroscopy, which substantiates the presence of metal iron and silicon functional groups. Powder X-ray diffraction analysis establishes the phase purity and composition. X-ray photoelectron spectroscopy analysis demonstrates the formation of α-Fe2O3@SiO2 core-shell nanospheres which is further corroborated by scanning electron microscopy images that authenticates the thickness of the shell is sufficiently larger than the core. A relatively high dielectric permittivity (1100) and low loss factor (1.51) is obtained at 1 KHz (at 40 °C). The material follows positive temperature coefficient of resistance type behavior as evidenced in the impedance analysis.
Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2018.08.250;
- PII
- S0925838818331384;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 771
- Journal Page Range
- p. 1-8
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55079164
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- DIELECTRIC MATERIALS; FERRITES; FOURIER TRANSFORM SPECTROMETERS; IRON; IRON OXIDES; PERMITTIVITY; SCANNING ELECTRON MICROSCOPY; SILICON; SILICON OXIDES; TEMPERATURE COEFFICIENT; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIELECTRIC PROPERTIES; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; FERRIMAGNETIC MATERIALS; IRON COMPOUNDS; MAGNETIC MATERIALS; MATERIALS; MEASURING INSTRUMENTS; METALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; REACTIVITY COEFFICIENTS; SCATTERING; SEMIMETALS; SILICON COMPOUNDS; SPECTROMETERS; SPECTROSCOPY; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2018 Elsevier B.V. All rights reserved.