Published November 1, 2019
| Version v1
Journal article
Effect of He2+ Ion Irradiation on the Crystal Structure of Non-stoichiometric Sm2+xZr2-xO7-x/2 (x = 0, 0.2, 0.4, 0.6)
Creators
- 1. College of Materials Science and Engineering, Beijing University of Technology, Beijing 100124 (China)
Description
In this paper, a series of non-stoichiometric Sm2+xZr2-xO7-x/2 (x=0, 0.2, 0.4, 0.6) were synthesized by chemical co-precipitation method. He2+ ion irradiation experiments were carried out with irradiation energy of 500 KeV and irradiation flux of 5×1016 ions/cm2. Effect of He2+ ion irradiation on the crystal structure was characterized by XRD, GIXRD, and Raman spectroscopy. The XRD patterns show that all the peaks shift to lower diffraction angles and the characteristic peaks of pyrochlore structure weaken after irradiation, which suggests an expansion of the lattice and the degeneration of pyrochlore structure. Moreover, the GIXRD patterns reveal the existence of an irradiated layer on the surface of the sample. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1757-899X/678/1/012074Additional details
Identifiers
Publishing Information
- Journal Title
- IOP Conference Series. Materials Science and Engineering (Online)
- Journal Volume
- 678
- Journal Issue
- 1
- Journal Page Range
- [8 p.]
- ISSN
- 1757-899X
Conference
- Title
- 11. International Conference on High-Performance Ceramics
- Dates
- 25-29 May 2019
- Place
- Kunming (China)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54077353
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COPRECIPITATION; CRYSTAL STRUCTURE; HELIUM IONS; IRRADIATION; LAYERS; PYROCHLORE; RAMAN SPECTROSCOPY; STOICHIOMETRY; SURFACES; X-RAY DIFFRACTION
- Descriptors DEC
- CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; IONS; LASER SPECTROSCOPY; MINERALS; PRECIPITATION; SCATTERING; SEPARATION PROCESSES; SPECTROSCOPY