Fabrication and characterization of solution processed vertically aligned ZnO microrods
Creators
- 1. Department of Laser Sciences and Interactions, National Institute of Laser Enhanced Sciences, Cairo University, 12613 Giza (Egypt)
- 2. Laboratoire de Nanotechnologie et d'Instrumentation Optique, Institut Charles Delaunay, CNRS UMR 6279, Université de Technologie de Troyes, 12 rue Marie Curie, BP 2060, 10010 Troyes Cedex (France)
Description
Simple and effective cost high quality vertically aligned densely packed ZnO microrods have been prepared using solution processed two-step deposition process, specifically sol–gel spin coating combined with chemical bath deposition. X-ray diffraction pattern and scanning electron microscope show that there has been preferential crystal orientation along c-axis and the growth of the microrods has occurred normal to the glass substrate and the facets of the these microrods are hexagons. Photoluminescence measurements showed an emission band in the UV region and another weak band in the visible region with the emission intensity of UV band grows superlinearly with the excitation intensity. The film shows an electrical resistivity of 136 Ω cm as evaluated from four-point probe method. The fabricated film has been used as UV detector through Au/SiO2/ZnO structure on glass substrate as the structure shows higher current under illumination compared to without illumination
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2014.05.037Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2014.05.037;
- PII
- S0169-4332(14)01054-X;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 311
- Journal Page Range
- p. 172-176
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46106696
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- COMPARATIVE EVALUATIONS; CRYSTALS; ELECTRIC CONDUCTIVITY; EXCITATION; FABRICATION; FILMS; GLASS; ILLUMINANCE; PHOTOLUMINESCENCE; SCANNING ELECTRON MICROSCOPY; SILICA; SILICON OXIDES; SPIN-ON COATING; SUBSTRATES; X-RAY DIFFRACTION; ZINC OXIDES
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; EMISSION; ENERGY-LEVEL TRANSITIONS; EVALUATION; LUMINESCENCE; MICROSCOPY; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PHOTON EMISSION; PHYSICAL PROPERTIES; SCATTERING; SILICON COMPOUNDS; SURFACE COATING; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.