Thermally controlled band gap tuning in CuO nano thin films for optoelectronic applications
Creators
- 1. Department of Physics, Hitit University, Corum (Turkey)
- 2. Department of Electrical and Electronics Engineering, Atilim University, Ankara (Turkey)
- 3. Department of Physics, Middle East Technical University, Ankara (Turkey)
Description
Temperature dependency of band gap in CuO nano thin films has been investigated by virtue of transmission experiments at different temperatures. Structural and morphological characterization were achieved using X-ray diffraction (XRD) and scanning electron microscopy (SEM) measurements. Analysis on the XRD diffractogram revealed the presence of monoclinic structure for the CuO. Average crystallite size was determined as 17.8 nm. Absorption characteristics in between 10 and 300 K were presented in the wavelength range of 360-1100 nm. The band gap of the CuO was found to be * 2.17 eV at 300 K using Tauc and spectral derivative methods. This value increased to 2.24 eV at 10 K. Both methods showed that the band gap extended with decreasing temperature. Temperature dependency of the band gap was studied using Varshni relation. The band gap at absolute temperature, variation of the band gap with temperature and Debye temperature were calculated as 2.242 ± 0.002 eV, - 5.4 ± 0.2 9 10-4 eV/K and 394 ± 95 K, respectively. (author)
Additional details
Identifiers
Publishing Information
- Journal Title
- Indian Journal of Physics (Online)
- Journal Volume
- 98
- Journal Issue
- 12
- Journal Page Range
- p. 4155-4160
- ISSN
- 0974-9845
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 55103384
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- BAND THEORY; COPPER OXIDES; CRYSTALLOGRAPHY; DEBYE TEMPERATURE; GRADED BAND GAPS; NANOSTRUCTURES; NANOTECHNOLOGY; SEMICONDUCTOR MATERIALS; STRUCTURAL CHEMICAL ANALYSIS; TEMPERATURE DEPENDENCE; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; COPPER COMPOUNDS; DIFFRACTION; MATERIALS; OXIDES; OXYGEN COMPOUNDS; SCATTERING; TRANSITION ELEMENT COMPOUNDS