Published 2001 | Version v1
Report Metadata-only

Scanning Probe Microscopy Characterization of Co/Cu Multilayers Growth

Creators

  • 1. The Henryk Niewodniczanski Institute of Nuclear Physics, Cracow (Poland)
  • 2. Institute of Applied Physics, National Academy of Sciences of Ukraine, Sumy (Ukraine)
  • 3. Institut fuer Kerphysik, Universitaet Muenster, Muenster (Germany)

Description

no abstract available

Part of:
The Henryk Niewodniczanski Institute of Nuclear Physics, Cracow, Poland, - Annual Report 2000

Additional details

Identifiers

URL
https://www.ifj.edu.pl/en/;

Publishing Information

Imprint Title
The Henryk Niewodniczanski Institute of Nuclear Physics, Cracow, Poland, - Annual Report 2000
Imprint Pagination
287 p.
Journal Page Range
p. 62
ISSN
1425-3763
Report number
INP--1874

INIS

Country of Publication
Poland
Country of Input or Organization
Poland
INIS RN
32045143
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Progress Report, No Abstract, Non-conventional Literature
Descriptors DEI
ATOMIC FORCE MICROSCOPY; COBALT; COPPER; CRYSTAL GROWTH; LAYERS; LEAD; PROGRESS REPORT; ROUGHNESS; SILICON; SUBSTRATES; THICKNESS; THIN FILMS
Descriptors DEC
DIMENSIONS; DOCUMENT TYPES; ELEMENTS; FILMS; METALS; MICROSCOPY; SEMIMETALS; SURFACE PROPERTIES; TRANSITION ELEMENTS

Optional Information

Notes
2 refs, 1 fig