Published October 2010 | Version v1
Journal article

2D electron cyclotron emission imaging at ASDEX Upgrade (invited)

  • 1. FOM-Institute for Plasma Physics, Rijnhuizen, 3430 BE Nieuwegein (Netherlands)
  • 2. Max Planck Institut fuer Plasmaphysik, 85748 Garching (Germany)
  • 3. University of California at Davis, Davis, California 95616 (United States)
  • 4. Eindhoven University of Technology, 5600 MB Eindhoven (Netherlands)
  • 5. POSTECH, Pohang, Gyeongbuk, 790-784 (Korea, Republic of)
  • 6. University of Colorado, Boulder, Colorado 80309 (United States)

Description

The newly installed electron cyclotron emission imaging diagnostic on ASDEX Upgrade provides measurements of the 2D electron temperature dynamics with high spatial and temporal resolution. An overview of the technical and experimental properties of the system is presented. These properties are illustrated by the measurements of the edge localized mode and the reversed shear Alfven eigenmode, showing both the advantage of having a two-dimensional (2D) measurement, as well as some of the limitations of electron cyclotron emission measurements. Furthermore, the application of singular value decomposition as a powerful tool for analyzing and filtering 2D data is presented.

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
81
Journal Issue
10
Journal Page Range
p. 10D929-10D929.6
ISSN
0034-6748
CODEN
RSINAK

Optional Information

Notes
(c) 2010 American Institute of Physics