Published 1986
| Version v1
Book
The effects of an electronic component radiation qualification program on satellite longevity and shielding requirements
Creators
- 1. Sandia National Laboratories, Albuquerque, NM (USA)
- 2. Air Force Weapons Laboratory, Kirtland AFB, NM (USA)
Description
Current electronic component radiation qualification test methods are believed to seriously underestimate component radiation hardness, and hence, underestimate a satellite's longevity in the natural space radiation environment. Recent research shows several problems with the current test techniques and indicates that linear systems theory may not be applicable to predicting low dose rate response from high dose rate laboratory data. Analysis of published data and use of a simple computer model suggest that high dose rate laboratory test data may actually overestimate low dose rate component survivability
Additional details
Additional titles
- Original title (no language)
- Textes des conferences du 5. Colloque international de fiabilite et de maintenabilite.
Publishing Information
- Publisher
- ADERA-CEA.
- Imprint Place
- Saint-Medard-en-Jalles (France)
- Imprint Title
- Proceedings of the 5. International conference on reliability and maintainability
- Imprint Pagination
- 1033 p.
- Journal Page Range
- p. 704-709.
Conference
- Title
- 5. International conference on reliability and maintainability.
- Dates
- 6-10 Oct 1986.
- Place
- Biarritz (France).
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 18077157
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COMPUTERIZED SIMULATION; COSMIC RADIATION; DOSE RATES; FAILURE MODE ANALYSIS; MOSFET; NONLINEAR PROBLEMS; PHYSICAL RADIATION EFFECTS; TESTING; TIME DEPENDENCE
- Descriptors DEC
- FIELD EFFECT TRANSISTORS; IONIZING RADIATIONS; MOS TRANSISTORS; RADIATION EFFECTS; RADIATIONS; SEMICONDUCTOR DEVICES; SIMULATION; SYSTEM FAILURE ANALYSIS; SYSTEMS ANALYSIS; TRANSISTORS
Optional Information
- Notes
- Imprint:Textes des conferences du 5. Colloque international de fiabilite et de maintenabilite.