Published September 2005 | Version v1
Journal article

Visualization of single-wall carbon nanotube (SWNT) networks in conductive polystyrene nanocomposites by charge contrast imaging

  • 1. Laboratory of Materials and Interface Chemistry, Eindhoven University of Technology, 5600 MB Eindhoven (Netherlands) and Laboratory of Polymer Technology, Eindhoven University of Technology, 5600 MB Eindhoven (Netherlands) and Dutch Polymer Institute, Eindhoven University of Technology, 5600 MB Eindhoven (Netherlands)
  • 2. NT-MDT Ltd., 124460, Moscow (Russian Federation)
  • 3. Laboratory of Materials and Interface Chemistry, Eindhoven University of Technology, 5600 MB Eindhoven (Netherlands)
  • 4. Laboratory of Polymer Chemistry, Eindhoven University of Technology, 5600 MB Eindhoven (Netherlands)
  • 5. Dutch Polymer Institute, Eindhoven University of Technology, 5600 MB Eindhoven (Netherlands)
  • 6. Department of Chemical Engineering and The Ilse Katz Center for Meso and Nanoscale Science and Technology, Ben-Gurion University in the Negev, 84105 Beer-Sheva (Israel)

Description

The morphology of conductive nanocomposites consisting of low concentration of single-wall carbon nanotubes (SWNT) and polystyrene (PS) has been studied using atomic force microscopy (AFM), transmission electron microscopy (TEM) and, in particular, scanning electron microscopy (SEM). Application of charge contrast imaging in SEM allows visualization of the overall SWNT dispersion within the polymer matrix as well as the identification of individual or bundled SWNTs at high resolution. The contrast mechanism involved will be discussed. In conductive nanocomposites the SWNTs are homogeneously dispersed within the polymer matrix and form a network. Beside fairly straight SWNTs, strongly bended SWNTs have been observed. However, for samples with SWNT concentrations below the percolation threshold, the common overall charging behavior of an insulating material is observed preventing the detailed morphological investigation of the sample

Additional details

Identifiers

DOI
10.1016/j.ultramic.2005.03.007;
PII
S0304-3991(05)00052-5;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
104
Journal Issue
2
Journal Page Range
p. 160-167
ISSN
0304-3991
CODEN
ULTRD6

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.