An extended collection length model for the description of keV-electron induced degradation and thermal recovery of p-i-n solar cells

The results of keV-electron degradation and annealing experiments obtained on a-Si:H based p-i-n solar cells are interpretated under inclusion of models developed earlier for the degradation of a-Si:H films and are placed in the framework of an extended collection length model. The strong degradation of the cell parameters jsc and FF due to considerable keV-electron irradiation can be explained quantitatively. This enables a crucial test of the validity of the mathematical models for the keV-electron induced effects developed so far. Furthermore the results of a detailed investigation of the thermal recovery of electron-degraded solar cells can be cleared up consistently. Some unresolved issues are discussed, and experiments to resolve these questions are proposed