Published May 25, 2012 | Version v1
Journal article

Progress on precision measurements of inner shell transitions in highly charged ions at an ECR ion source

  • 1. Laboratoire Kastler Brossel, Ecole Normale Superieure, CNRS, Universite Pierre et Marie Curie- Paris 6, Case 74, 4 place Jussieu, F-75005 Paris (France)
  • 2. Faculdade de Ciencias e Tecnologia, FCT, Universidade Nova de Lisboa, 2829-516 Caparica (Portugal)
  • 3. Centro de Fisica Atomica, CFA, Departamento de Fisica (Portugal)

Description

Inner shell transitions of highly charged ions produced in the plasma of an Electron Cyclotron Resonance Ion Source (ECRIS) were observed the first time by a Double Crystal Spectrometer (DCS). The DCS is a well-used tool in precision x-ray spectroscopy due to its ability of precision wavelength measurement traced back to a relative angle measurement. Because of its requirement for a bright x-ray source the DCS has not been used before in direct measurements of highly charged ions (HCI). Our new precision measurement of inner shell transitions in HCI is not just going to provide new x-ray standards for quantum metrology but can also give information about the plasma in which the ions reside. Ionic temperatures and with that the electron density can be determined by thorough examination of line widths measured with great accuracy.

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1438
Journal Issue
1
Journal Page Range
p. 236-239
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
17. international conference on atomic processes in plasmas (ICAPIP)
Dates
19-22 Jul 2011
Place
Belfast, Northern Ireland (United Kingdom)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43094174
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CRYSTALS; ECR ION SOURCES; ELECTRON DENSITY; ELECTRON TEMPERATURE; ELECTRONIC STRUCTURE; ENERGY-LEVEL TRANSITIONS; ION TEMPERATURE; LINE WIDTHS; MULTICHARGED IONS; PLASMA; PLASMA DENSITY; PLASMA DIAGNOSTICS; WAVELENGTHS; X-RAY SOURCES; X-RAY SPECTRA; X-RAY SPECTROSCOPY
Descriptors DEC
CHARGED PARTICLES; ION SOURCES; IONS; RADIATION SOURCES; SPECTRA; SPECTROSCOPY

Optional Information

Notes
(c) 2012 American Institute of Physics