Progress on precision measurements of inner shell transitions in highly charged ions at an ECR ion source
Creators
- 1. Laboratoire Kastler Brossel, Ecole Normale Superieure, CNRS, Universite Pierre et Marie Curie- Paris 6, Case 74, 4 place Jussieu, F-75005 Paris (France)
- 2. Faculdade de Ciencias e Tecnologia, FCT, Universidade Nova de Lisboa, 2829-516 Caparica (Portugal)
- 3. Centro de Fisica Atomica, CFA, Departamento de Fisica (Portugal)
Description
Inner shell transitions of highly charged ions produced in the plasma of an Electron Cyclotron Resonance Ion Source (ECRIS) were observed the first time by a Double Crystal Spectrometer (DCS). The DCS is a well-used tool in precision x-ray spectroscopy due to its ability of precision wavelength measurement traced back to a relative angle measurement. Because of its requirement for a bright x-ray source the DCS has not been used before in direct measurements of highly charged ions (HCI). Our new precision measurement of inner shell transitions in HCI is not just going to provide new x-ray standards for quantum metrology but can also give information about the plasma in which the ions reside. Ionic temperatures and with that the electron density can be determined by thorough examination of line widths measured with great accuracy.
Additional details
Identifiers
- DOI
- 10.1063/1.4707884;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1438
- Journal Issue
- 1
- Journal Page Range
- p. 236-239
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 17. international conference on atomic processes in plasmas (ICAPIP)
- Dates
- 19-22 Jul 2011
- Place
- Belfast, Northern Ireland (United Kingdom)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43094174
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRYSTALS; ECR ION SOURCES; ELECTRON DENSITY; ELECTRON TEMPERATURE; ELECTRONIC STRUCTURE; ENERGY-LEVEL TRANSITIONS; ION TEMPERATURE; LINE WIDTHS; MULTICHARGED IONS; PLASMA; PLASMA DENSITY; PLASMA DIAGNOSTICS; WAVELENGTHS; X-RAY SOURCES; X-RAY SPECTRA; X-RAY SPECTROSCOPY
- Descriptors DEC
- CHARGED PARTICLES; ION SOURCES; IONS; RADIATION SOURCES; SPECTRA; SPECTROSCOPY
Optional Information
- Notes
- (c) 2012 American Institute of Physics