Published March 15, 2009
| Version v1
Journal article
Hydrogen effect on near-atmospheric nitrogen plasma assisted chemical vapor deposition of GaN film growth
- 1. Advanced Electronic Materials Center, National Institute for Materials Science, Tsukuba, Ibaraki 305-0044 (Japan)
- 2. Sekisui Chemical Co., Ltd., Wadai, Tsukuba, Ibaraki 300-4292 (Japan)
Description
The effect of hydrogen on near-atmospheric nitrogen plasma and low temperature growth of GaN thin film was investigated. To investigate nitrogen plasma diluted with hydrogen, optical emission spectroscopy (OES) was employed. OES indicates that hydrogen enhances the generation of the nitrogen first positive system and first negative systems by providing an additional kinetic pathway. The plasma also decomposed triethylgallium and generated Ga ions even at room temperature. Using this plasma, GaN film grew on sapphire substrate epitaxially at growth temperatures of above 170 deg. C and crystallized at 55 deg. C
Additional details
Identifiers
- DOI
- 10.1063/1.3086715;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 105
- Journal Issue
- 6
- Journal Page Range
- p. 066106-066106.3
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40062377
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CHEMICAL VAPOR DEPOSITION; CRYSTAL GROWTH; CRYSTALLIZATION; EMISSION SPECTROSCOPY; EPITAXY; GALLIUM IONS; GALLIUM NITRIDES; HYDROGEN; NITROGEN; PLASMA; SAPPHIRE; SEMICONDUCTOR MATERIALS; SUBSTRATES; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K; THIN FILMS
- Descriptors DEC
- CHARGED PARTICLES; CHEMICAL COATING; CORUNDUM; CRYSTAL GROWTH METHODS; DEPOSITION; ELEMENTS; FILMS; GALLIUM COMPOUNDS; IONS; MATERIALS; MINERALS; NITRIDES; NITROGEN COMPOUNDS; NONMETALS; OXIDE MINERALS; PHASE TRANSFORMATIONS; PNICTIDES; SPECTROSCOPY; SURFACE COATING; TEMPERATURE RANGE
Optional Information
- Notes
- (c) 2009 American Institute of Physics