Published 1998 | Version v1
Book

Epitaxial growth mechanism and physical properties of ultra thin films of La0.6Sr0.4MnO3

  • 1. Joint Research Center for Atom Technology, Tsukuba (Japan)
  • 2. Tokyo Inst. of Tech., Yokohama (Japan). Dept. of Innovative and Engineered Materials
  • 3. Joint Research Center for Atomic Technology, Tsukuba (Japan)
  • 4. Univ. of Tokyo (Japan). Dept. of Applied Physics

Description

Thin films of La1-xSrxMnO3 (x = 0.4) were fabricated using pulsed laser deposition (PLD) methods. The surface morphology of the films was sensitively affected by oxygen pressure during deposition. At high oxygen pressure (∼ 150 mTorr), randomly aligned grains were nucleated on the epitaxial film. When the pressure was reduced to 100 mTorr, the epitaxial film had very smooth surface. Under this condition, the thickness dependence of resistivity and magnetization were analyzed. Even 6 nm thick film showed ferromagnetic metallic behavior. The AFM images of ultra thin films deposited on wet-etched SrTiO3 showed atomically flat terraces and 0.4 nm steps. The film growth mode can be tuned to either layer by layer or step flow by the deposition temperature

Additional details

Publishing Information

Publisher
Materials Research Society
Imprint Place
Warrendale, PA (United States)
ISBN
1-55899-399-1
Imprint Title
Science and technology of magnetic oxides
Imprint Pagination
375 p.
Series
Materials Research Society symposium proceedings, Volume 494
Journal Page Range
p. 9-14

Conference

Title
1997 fall meeting of the Materials Research Society
Dates
1-5 Dec 1997
Place
Boston, MA (United States)

Optional Information