Published September 1, 2004
| Version v1
Journal article
Control of the fabrication process for the sensors of the CMS silicon strip tracker
Creators
Description
The inner tracking system of the Compact Muon Solenoid experiment at the Large Hadron Collider consists of the world largest Silicon Strip Tracker. A detailed quality assurance program is under way to ensure the full compliance of all delivered sensors with the technical specifications. The focus will be here on the ''Process Qualification Control'' to monitor the stability of the fabrication process throughout the production phase. A description of the setup in the three laboratories involved (Florence, Strasbourg, Vienna) is given and the results obtained with the first delivered batches are shown
Additional details
Identifiers
- DOI
- 10.1016/j.nima.2004.05.047;
- PII
- S0168900204010332;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 530
- Journal Issue
- 1-2
- Journal Page Range
- p. 54-58
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 6. international conference on large scale applications and radiation hardness of semiconductor detectors
- Dates
- 29 Sep - 1 Oct 2003
- Place
- Florence (Italy)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36018997
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CERN LHC; CONTROL; FABRICATION; MULTIPARTICLE SPECTROMETERS; PARTICLE DISCRIMINATION; PARTICLE TRACKS; PHYSICAL RADIATION EFFECTS; QUALITY ASSURANCE; SI MICROSTRIP DETECTORS
- Descriptors DEC
- ACCELERATORS; CYCLIC ACCELERATORS; MEASURING INSTRUMENTS; PARTICLE IDENTIFICATION; RADIATION DETECTORS; RADIATION EFFECTS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; SPECTROMETERS; STORAGE RINGS; SYNCHROTRONS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.