Variation in chemical bath pH and the corresponding precursor concentration for optimizing the optical, structural and morphological properties of ZnO thin films
Creators
- 1. Nano Information Technology Academy, Dongguk University (Korea, Republic of)
- 2. Maharishi Markandeshwar University, Department of Physics (India)
- 3. Maharaja Agrasen University, School of Basic and Applied Sciences (India)
- 4. Dongguk University, Department of Biological and Environmental Science, College of Life Science and Biotechnology (Korea, Republic of)
- 5. Sadguru Gadage Maharaj College, Department of Chemistry (India)
- 6. Dongguk University-Seoul, Research Institute of Biotechnology and Medical Converged Science (Korea, Republic of)
- 7. Amity University, Department of Applied Physics, Amity Institute of Applied Sciences (AIAS) (India)
Description
In the present study, ZnO thin films were deposited by chemical bath deposition carried out by selective correlation of varying (i) pH values at fixed concentration and (ii) concentration of the precursors at fixed pH. The selective correlations were done by using the characterization tools like X-ray diffraction, scanning electron microscopy, transmittance, refractive index, dielectric constant, Fourier-transform infrared spectroscopy and IV measurements. Transmittance was found to increase from 57 to 87% on varying the pH from basic side (10.8) to acidic side (pH 6.8) with a blue shift in band gap. The nature and morphology of the deposited films were found to be dependent on pH as well as concentration. Acidic pH 5.0 was found to be most suitable for deposition of highly transparent film with low absorption coefficient, refractive index and dielectric constant. On the other hand, nearly complete coverage of the substrate and high purity was observed in the ZnO thin films which was deposited by taking equal 100 mM concentration of Zn(NO3) and HMTA precursors at a fixed pH 5.0 as desired, sheet resistance was also found to increase on the acidic pH side which is useful in case of buffer layer solar cell application. These studies lay a foundation stone for understanding the optical and morphological parameters by selectively correlating the pH and concentration variation at the same time.
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Materials Science. Materials in Electronics
- Journal Volume
- 30
- Journal Issue
- 19
- Journal Page Range
- p. 17747-17758
- ISSN
- 0957-4522
- CODEN
- JSMEEV
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52023915
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- DEPOSITION; DEPOSITS; DIELECTRIC MATERIALS; FOUNDATIONS; FOURIER TRANSFORM SPECTROMETERS; MORPHOLOGY; NITROGEN OXIDES; PRECURSOR; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SOLAR CELLS; THIN FILMS; VARIATIONS; X-RAY DIFFRACTION; ZINC OXIDES
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; DIRECT ENERGY CONVERTERS; ELECTRON MICROSCOPY; EQUIPMENT; FILMS; MATERIALS; MEASURING INSTRUMENTS; MECHANICAL STRUCTURES; MICROSCOPY; NITROGEN COMPOUNDS; OPTICAL PROPERTIES; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRIC CELLS; PHOTOVOLTAIC CELLS; PHYSICAL PROPERTIES; SCATTERING; SOLAR EQUIPMENT; SPECTROMETERS; SUPPORTS; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2019 Springer Science+Business Media, LLC, part of Springer Nature