Published 2012
| Version v1
Journal article
The SHARAQ spectrometer
- 1. RIKEN, Nishina Center for Accelerator-Based Science, Wako, Saitama (Japan)
- 2. Tokyo University, Center for Nuclear Study, Tokyo (Japan)
Description
The SHARAQ spectrometer and a high-resolution beam-line have been constructed at the RI Beam Factory at RIKEN. They are designed to achieve a momentum resolution of δp/p=1/14 700 and an angular resolution of 1 mrad. Low-pressure multi-wire drift chambers working at a high rate of 2 MHz and cathode read-out drift chambers have been developed as beam-line tracking detectors and focal plane detectors, respectively. A method that facilitates quick tuning of the RI beam transport has been established. The SHARAQ spectrometer and the beam-line were commissioned in 2009 and put into use in several experimental programs that exploits advantages of RI-beam induced charge exchange reactions. (author)
Availability note (English)
Available from http://dx.doi.org/10.1093/ptep/pts042Additional details
Identifiers
- DOI
- 10.1093/ptep/pts042;
Publishing Information
- Journal Title
- Progress of Theoretical and Experimental Physics
- Journal Volume
- 2012
- Journal Issue
- 1
- Journal Page Range
- p. 03C007.1-03C007.11
- ISSN
- 2050-3911
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 48070982
- Subject category
- S43: PARTICLE ACCELERATORS;
- Descriptors DEI
- DEUTERON BEAMS; DRIFT CHAMBERS; EXCITED STATES; IN-BEAM SPECTROSCOPY; LINEAR MOMENTUM RESOLUTION; MAGNETIC ANALYZERS; N BARYONS; NUCLEAR PHYSICS; PROTON BEAMS; QUADRUPOLE LINACS; RADIOACTIVE ION BEAMS; RILAC; SUPERCONDUCTING MAGNETS
- Descriptors DEC
- ACCELERATORS; BARYONS; BEAM ANALYZERS; BEAMS; ELECTRICAL EQUIPMENT; ELECTROMAGNETS; ELEMENTARY PARTICLES; ENERGY LEVELS; EQUIPMENT; FERMIONS; HADRONS; HEAVY ION ACCELERATORS; ION BEAMS; LINEAR ACCELERATORS; MAGNETS; MEASURING INSTRUMENTS; MULTIWIRE PROPORTIONAL CHAMBERS; N*BARYONS; NUCLEON BEAMS; PARTICLE BEAMS; PHYSICS; PROPORTIONAL COUNTERS; RADIATION DETECTORS; RESOLUTION; SPECTROSCOPY; SUPERCONDUCTING DEVICES
Optional Information
- Notes
- 23 refs., 10 figs., 2 tabs.