Thickness dependent optical and electrical properties of CdSe thin films
- 1. Department of Physics, Mohanlal Sukhadia University, Udaipur-313001 (India)
- 2. Microelectronics Research Center, Iowa State University of Science and Technology, Ames, IA50011 (United States)
- 3. Centre of Excellence for Energy and Environmental Studies, Deenbandhu Chhotu Ram University of Science and Technology, Murthal, Sonepat-131039 (India)
- 4. Department of Physics, University of Rajasthan, Jaipur-302001 (India)
Description
The effect of thickness on the optical and electrical properties of CdSe thin films is investigated in this paper. The films of thickness 445 nm, 631 nm and 810 nm were deposited on glass and ITO coated glass substrates using thermal evaporation technique. The deposited thin films were thermally annealed in air atmosphere at temperature 100°C and were subjected to UV-Vis spectrophotometer and source meter for optical and electrical analysis respectively. The absorption coefficient is observed to increase with photon energy and found maximum in higher photon energy region. The extinction coefficient and refractive index are also calculated. The electrical analysis shows that the electrical resistivity is observed to be decreased with thickness.
Additional details
Identifiers
- DOI
- 10.1063/1.4946642;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1728
- Journal Issue
- 1
- Journal Page Range
- vp.
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- International conference on condensed matter and applied physics
- Acronym
- ICC 2015
- Dates
- 30-31 Oct 2015
- Place
- Bikaner (India)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48052347
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION; ANNEALING; CADMIUM SELENIDES; ELECTRIC CONDUCTIVITY; EVAPORATION; GLASS; OPTICAL PROPERTIES; PHOTONS; REFRACTIVE INDEX; SPECTROPHOTOMETERS; SUBSTRATES; THICKNESS; THIN FILMS
- Descriptors DEC
- BOSONS; CADMIUM COMPOUNDS; CHALCOGENIDES; DIMENSIONS; ELECTRICAL PROPERTIES; ELEMENTARY PARTICLES; FILMS; HEAT TREATMENTS; MASSLESS PARTICLES; MEASURING INSTRUMENTS; OPTICAL PROPERTIES; PHASE TRANSFORMATIONS; PHYSICAL PROPERTIES; SELENIDES; SELENIUM COMPOUNDS; SORPTION
Optional Information
- Notes
- (c) 2016 Author(s)