Published May 2008 | Version v1
Journal article

A dielectric resonator method of measuring dielectric properties of low loss materials in the microwave region

Creators

  • 1. Department of Electronic Engineering, National Formosa University, Hu-Wei, Yun-Lin 632, Taiwan (China)

Description

A technique for the measurement of dielectric properties of low loss and homogeneously isotropic media in the microwave region is studied. The measuring structure is a resonator made up of a cylindrical dielectric rod and conducting plates. The dielectric constants and loss tangents are computed from the resonant frequencies, structure dimensions and unloaded Qs of the TE01δ mode. A simple field model is introduced to analyze this resonator structure. Unlike other simple models, this model does not have the defect of low measurement accuracy of dielectric properties. Important factors affecting the dielectric properties measurements are introduced. Error sources for measurements are also discussed. The measurement accuracy is justified by comparing the results with those of other techniques. In addition, various methods for calculating the power factor and conducting loss and for measuring the conductivity of the conducting plates are discussed. The accuracies of certain of these methods have not previously been studied, but are given in this paper. The swept frequency capability was also studied. It was found that dielectric properties in microwave frequencies could be measured within a frequency range of 3 GHz

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-0233/19/5/055701

Additional details

Identifiers

DOI
10.1088/0957-0233/19/5/055701;
PII
S0957-0233(08)62379-6;

Publishing Information

Journal Title
Measurement Science and Technology
Journal Volume
19
Journal Issue
5
Journal Page Range
[11 p.]
ISSN
0957-0233
CODEN
MSTCEP