Published January 1974 | Version v1
Journal article

Line form on semiconductor spectrometers for ionizing radiations

  • 1. Moskovskij Inzhenerno-Fizicheskij Inst. (USSR)

Description

no abstract available

Additional details

Additional titles

Original title (Russian)
Форма линии полупроводниковых спектрометров ионизирующих излучений

Publishing Information

Journal Title
Prib. Tekh. Ehksp.
Journal Issue
no.1
Series
Prib. Tekh. Ehksp.

INIS

Country of Publication
USSR
Country of Input or Organization
USSR
INIS RN
5146751
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
No Abstract
Descriptors DEI
AMPLITUDES; ENERGY LOSSES; GAUSS FUNCTION; SEMICONDUCTOR DETECTORS; SPECTRA; SPECTROMETERS
Descriptors DEC
FUNCTIONS; MEASURING INSTRUMENTS; RADIATION DETECTORS

Optional Information

Notes
For English translation see the journal Instrum. Exp. Tech.. Published in summary form only (Deposited article).