Published 2020 | Version v1
Book Metadata-only

Characterization of detectors using Monte Carlo simulation and evolutionary algorithms

Creators

  • 1. Inst. Atomnoj Ehnergii NYaTs RK, Kurchatov (Kazakhstan)

Description

no abstract available

Part of:
X International scientific and practical conference «Physical and technical problems in science, industry and medicine. Russian and International experience of personnel training». Collection of abstracts

Additional details

Additional titles

Original title (Russian)
Характеризация детекторов с использованием моделирования Монте-Карло и эволюционных алгоритмов

Publishing Information

Publisher
Izd-vo Veter
Imprint Place
Tomsk (Russian Federation)
ISBN
978-5-98428-107-2
Imprint Title
X International scientific and practical conference #Left-Pointing Double Angle Quotation Mark#Physical and technical problems in science, industry and medicine. Russian and International experience of personnel training#Right-Pointing Double Angle Quotation Mark#. Collection of abstracts
Imprint Pagination
145 p.
Journal Page Range
p. 79

Conference

Title
10. international scientific and practical conference on physical and technical problems in science, industry and medicine.Russian and International experience of personnel training
Original Conference Title
X Mezhdunarodnaya nauchno-prakticheskaya konferentsiya «Fiziko-tekhnicheskie problemy v nauke, promyshlennosti i meditsine. Rossijskij i mezhdunarodnyj opyt podgotovki kadrov»
Dates
9-11 Sep 2020
Place
Tomsk (Russian Federation)

INIS

Country of Publication
Russian Federation
Country of Input or Organization
Russian Federation
INIS RN
53089373
Subject category
S97: MATHEMATICAL METHODS AND COMPUTING; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
No Abstract, Conference
Descriptors DEI
GENETIC ALGORITHMS; HIGH-PURITY GE DETECTORS; MATHEMATICAL EVOLUTION; MATHEMATICAL MODELS; MONTE CARLO METHOD; OPTIMIZATION; SPECTROMETERS
Descriptors DEC
ALGORITHMS; CALCULATION METHODS; EVOLUTION; GE SEMICONDUCTOR DETECTORS; MATHEMATICAL LOGIC; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS

Optional Information

Notes
Imprint:X Mezhdunarodnaya nauchno-prakticheskaya konferentsiya #Left-Pointing Double Angle Quotation Mark#Fiziko-tekhnicheskie problemy v nauke, promyshlennosti i meditsine. Rossijskij i mezhdunarodnyj opyt podgotovki kadrov#Right-Pointing Double Angle Quotation Mark#. Sbornik tezisov dokladov