Published 1990 | Version v1
Book

Measurement of surface recombination velocity on heavily doped indium phosphide

  • 1. Cleveland State Univ., OH (USA). Dept. of Electrical Engineering
  • 2. National Aeronautics and Space Administration, Cleveland, OH (USA). Lewis Research Center

Description

The controversy surrounding the published low values of surface recombination velocity (SRV) in n-InP, solidified in recent years when modeling of existing n/p InP solar cells revealed that the front surface SRV had to be higher than 1 x 106 cm/sec in order to justify the poor blue response that is characteristic of all n/p InP solar cells. In this paper, SRV on heavily doped (>1018cm-3)n-type and p-type InP is measured as a function of surface treatment. For the limited range of substrates and surface treatments studied, SRV and surface stability depend strongly on the surface treatment. SRVs of ∼10 5cm/sec in both p-type and n-type InP are obtainable, but in n-type the low SRV surfaces were unstable, and the only stable surfaces on n-type had SRVs of >106cm/sec

Additional details

Publishing Information

Publisher
IEEE Service Center.
Imprint Place
Piscataway, NJ (USA)
Imprint Title
Twenty first IEEE photovoltaic specialists conference 1990 (Conference Record)
Imprint Pagination
1673 p.
Journal Page Range
p. 399-403.

Conference

Title
21. Institute for Electrical and Electronics Engineers (IEEE) photovoltaic specialists conference.
Dates
21-25 May 1990.
Place
Kissimmee, FL (USA).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
22052905
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CRYSTAL DOPING; INDIUM PHOSPHIDES; P-N JUNCTIONS; PERFORMANCE TESTING; RECOMBINATION; SOLAR CELLS; STABILITY; VELOCITY
Descriptors DEC
DIRECT ENERGY CONVERTERS; ELECTRONIC EQUIPMENT; EQUIPMENT; INDIUM COMPOUNDS; PHOSPHIDES; PHOSPHORUS COMPOUNDS; PNICTIDES; SEMICONDUCTOR JUNCTIONS; TESTING

Optional Information

Secondary number(s)
CONF-900542--.