Measurement of surface recombination velocity on heavily doped indium phosphide
- 1. Cleveland State Univ., OH (USA). Dept. of Electrical Engineering
- 2. National Aeronautics and Space Administration, Cleveland, OH (USA). Lewis Research Center
Description
The controversy surrounding the published low values of surface recombination velocity (SRV) in n-InP, solidified in recent years when modeling of existing n/p InP solar cells revealed that the front surface SRV had to be higher than 1 x 106 cm/sec in order to justify the poor blue response that is characteristic of all n/p InP solar cells. In this paper, SRV on heavily doped (>1018cm-3)n-type and p-type InP is measured as a function of surface treatment. For the limited range of substrates and surface treatments studied, SRV and surface stability depend strongly on the surface treatment. SRVs of ∼10 5cm/sec in both p-type and n-type InP are obtainable, but in n-type the low SRV surfaces were unstable, and the only stable surfaces on n-type had SRVs of >106cm/sec
Additional details
Publishing Information
- Publisher
- IEEE Service Center.
- Imprint Place
- Piscataway, NJ (USA)
- Imprint Title
- Twenty first IEEE photovoltaic specialists conference 1990 (Conference Record)
- Imprint Pagination
- 1673 p.
- Journal Page Range
- p. 399-403.
Conference
- Title
- 21. Institute for Electrical and Electronics Engineers (IEEE) photovoltaic specialists conference.
- Dates
- 21-25 May 1990.
- Place
- Kissimmee, FL (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 22052905
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRYSTAL DOPING; INDIUM PHOSPHIDES; P-N JUNCTIONS; PERFORMANCE TESTING; RECOMBINATION; SOLAR CELLS; STABILITY; VELOCITY
- Descriptors DEC
- DIRECT ENERGY CONVERTERS; ELECTRONIC EQUIPMENT; EQUIPMENT; INDIUM COMPOUNDS; PHOSPHIDES; PHOSPHORUS COMPOUNDS; PNICTIDES; SEMICONDUCTOR JUNCTIONS; TESTING
Optional Information
- Secondary number(s)
- CONF-900542--.