Multispectral/fluorescence CT using superconducting tunnel junction detector for 3-D material analysis
Description
We have developed superconducting tunnel junctions (STJs) for applications to astrophysics, particle physics, material physics, etc. The spectrum capability of STJs is the wide wavelength/energy range from visible light to X-ray. STJs are applicable to photon detectors with good energy resolution and a high photon-counting rate. STJs also have good efficiency because of their high absorption efficiency below 1 keV photon energy. This is advantageous in low photon emission observation like fluorescence from objects. STJs have potentials to open new windows of the Multispectral/fluorescence computed tomography (CT) below 1 keV photon energy. As first step, we are starting STJ-CT experiments from the high-energy X-ray region (6-20 keV). We report and discuss the CT using STJs
Additional details
Identifiers
- DOI
- 10.1016/j.nima.2003.11.330;
- PII
- S0168900203032625;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 520
- Journal Issue
- 1-3
- Journal Page Range
- p. 617-620
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 10. international workshop on low temperature detectors
- Dates
- 7-11 Jul 2003
- Place
- Genoa (Italy)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35084041
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ASTROPHYSICS; COMPUTERIZED TOMOGRAPHY; COUNTING RATES; ENERGY ABSORPTION; ENERGY EFFICIENCY; ENERGY RESOLUTION; FLUORESCENCE; JUNCTION DETECTORS; KEV RANGE 01-10; PHOTONS; SUPERCONDUCTING JUNCTIONS; WAVELENGTHS
- Descriptors DEC
- ABSORPTION; BOSONS; DIAGNOSTIC TECHNIQUES; EFFICIENCY; ELEMENTARY PARTICLES; EMISSION; ENERGY RANGE; KEV RANGE; LUMINESCENCE; MASSLESS PARTICLES; MEASURING INSTRUMENTS; PHOTON EMISSION; PHYSICS; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS; SORPTION; TOMOGRAPHY
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.