Published February 2002
| Version v1
Journal article
Computer simulation of switching characteristics in magnetic tunnel junctions exchange-biased by synthetic antiferromagnets
Description
The free layer switching characteristics in magnetic tunnel junctions with the structure NiFe/AlOx/Co (y nm)/Ru/Co (7-y nm)/FeMn/NiFe are investigated as functions of the relative Co layer thickness and the cell size by computer simulation. The bias field varies linearly with y, and the relative Co layer thickness dependence of the bias field is greater at smaller cell dimensions. At y=4, the bias field of the free layer remains nearly unchanged with the cell size, due to the balance of the stray field contribution from neighboring layers. The contribution from the lower permalloy layer (next to the FeMn) is found to be not small. The calculated hysteresis loops are in qualitative agreement with the experimental results
Additional details
Identifiers
- PII
- S0304885301005820;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 239
- Journal Issue
- 1-3
- Journal Page Range
- p. 123-125
- ISSN
- 0304-8853
- CODEN
- JMMMDC
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34003140
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM OXIDES; ANTIFERROELECTRIC MATERIALS; COBALT; COMPUTERIZED SIMULATION; HYSTERESIS; IRON COMPOUNDS; LAYERS; MANGANESE COMPOUNDS; NICKEL COMPOUNDS; PERMALLOY; RUTHENIUM; SIZE; SUPERCONDUCTING JUNCTIONS; SUPERCONDUCTIVITY; THICKNESS; TUNNEL EFFECT
- Descriptors DEC
- ALLOYS; ALUMINIUM COMPOUNDS; CHALCOGENIDES; DIELECTRIC MATERIALS; DIMENSIONS; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELEMENTS; IRON ALLOYS; MATERIALS; METALS; NICKEL ALLOYS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; PLATINUM METALS; REFRACTORY METALS; SIMULATION; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.