Published June 14, 2013
| Version v1
Journal article
New applications of the jellium model for the study of atomic clusters
- 1. St. Petersburg State Polytechnic University, Politekhnicheskaya ul. 29, 195251 St. Petersburg (Russian Federation)
- 2. Frankfurt Institute for Advanced Studies, Ruth-Moufang-Str. 1, 60438 Frankfurt am Main (Germany)
Description
Application of the jellium model for investigation of the electronic structure and photoionization of metal clusters and fullerenes is discussed. The valence electrons are considered either within the Hartree-Fock and the local density approximations. The random phase approximation is utilized to account for the many-electron correlations in the response of a system to an external field. It is shown that the photodetachment cross section and photoelectron angular distribution in metal cluster anions are described reasonably well within the jellium model. Its application to fullerenes requires the use of corrections for a better description of the ground state electron density.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/438/1/012009Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 438
- Journal Issue
- 1
- Journal Page Range
- [11 p.]
- ISSN
- 1742-6596
Conference
- Title
- International Conference on Dynamics of Systems on the Nanoscale
- Acronym
- DySoN 2012
- Dates
- 30 Sep - 4 Oct 2012
- Place
- St. Petersburg (Russian Federation)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44120099
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANGULAR DISTRIBUTION; ANIONS; ATOMIC CLUSTERS; CROSS SECTIONS; ELECTRON CORRELATION; ELECTRON DENSITY; ELECTRONIC STRUCTURE; ELECTRONS; FULLERENES; GROUND STATES; HARTREE-FOCK METHOD; METALS; NANOSTRUCTURES; PHOTOIONIZATION; RANDOM PHASE APPROXIMATION; VALENCE
- Descriptors DEC
- APPROXIMATIONS; CALCULATION METHODS; CARBON; CHARGED PARTICLES; CORRELATIONS; DISTRIBUTION; ELEMENTARY PARTICLES; ELEMENTS; ENERGY LEVELS; FERMIONS; IONIZATION; IONS; LEPTONS; NONMETALS