Frequency dependent ac transport of films of close-packed carbon nanotube arrays
- 1. Institute for Solid State Physics, University of Tokyo, Kashiwa, Chiba 277-8581 (Japan)
- 2. Graduate School of Engineering, Nagoya University, Nagoya, Aichi 464-8603 (Japan)
- 3. Institute of Materials and Systems for Sustainability, Nagoya University, Nagoya, Aichi 464-8603 (Japan)
Description
We have measured low-temperature ac impedance of films of closely-packed, highly-aligned carbon nanotubes prepared by thermal decomposition of silicon carbide wafers. The measurement was performed on films with the thickness (the length of the nanotubes) ranging from 6.5 to 65 nm. We found that the impedance rapidly decreases with the frequency. This can be interpreted as resulting from the electric transport via capacitive coupling between adjacent nanotubes. We also found numbers of sharp spikes superposed on frequency vs. impedance curves, which presumably represent resonant frequencies seen in the calculated conductivity of random capacitance networks. Capacitive coupling between the nanotubes was reduced by the magnetic field perpendicular to the films at 8.2 mK, resulting in the transition from negative to positive magnetoresistance with an increase of the frequency. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/969/1/012129Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 969
- Journal Issue
- 1
- Journal Page Range
- [6 p.]
- ISSN
- 1742-6596
Conference
- Title
- 28. International Conference on Low Temperature Physics
- Acronym
- LT28
- Dates
- 9-16 Aug 2017
- Place
- Gothenburg (Sweden)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52080289
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CAPACITANCE; CARBON NANOTUBES; ELECTRIC CURRENTS; FREQUENCY DEPENDENCE; IMPEDANCE; MAGNETIC FIELDS; MAGNETORESISTANCE; PYROLYSIS; SILICON CARBIDES; TEMPERATURE RANGE 0065-0273 K; THIN FILMS
- Descriptors DEC
- CARBIDES; CARBON; CARBON COMPOUNDS; CHEMICAL REACTIONS; CURRENTS; DECOMPOSITION; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELEMENTS; FILMS; NANOSTRUCTURES; NANOTUBES; NONMETALS; PHYSICAL PROPERTIES; SILICON COMPOUNDS; TEMPERATURE RANGE; THERMOCHEMICAL PROCESSES