Published January 2005 | Version v1
Journal article

Field ion microscopy and 3-D atom probe analysis of Al3Zr particles in 7050 Al alloy

  • 1. Department of Materials, Oxford University, Parks Road, Oxford OX1 3PH (United Kingdom)

Description

Field ion microscope images have been used to measure the local evaporation field of a Al3Zr particle in 7050 Al alloy. Using the matrix Al evaporation field (19 V/nm) as a reference, the evaporation field of Al3Zr has been estimated to be 36 V/nm, similar to the theoretical value for the field evaporation of Al2+ or Zr3+ ions. A strong local magnification effect from the large difference in evaporation fields between the particle and matrix has been found to cause a severe distortion of the apparent particle morphology in a three-dimensional atom probe reconstruction when using parameters based on the Al matrix. Use of the measured evaporation field for Al3Zr has allowed accurate reconstruction of the morphology of the particle. A simple worst-case analysis predicts that trajectory overlaps increase with increasing cross-section of particle, and the calculated overlaps agree well with experimental estimates of ∼1.4-2.0 nm for variations in the particle cross-section from 7 to 12 nm. The chemical composition of Al3Zr in a 7050 Al alloy has been measured to be 64.8-67.7 at% Al, 23.6-24.8 at% Zr, 6.9-9.1 at% Zn, 0.4-0.7 at% Cu, 0.5-1.2 at% Mg, with a (Al+Zn)/Zr ratio close to 3. Specimen analysis temperatures of either 25 or 80 K show little effect on the measured chemical compositions of the particle

Additional details

Identifiers

DOI
10.1016/j.ultramic.2004.09.006;
PII
S0304-3991(04)00177-9;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
102
Journal Issue
2
Journal Page Range
p. 151-159
ISSN
0304-3991
CODEN
ULTRD6

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37036560
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ALLOYS; ALUMINIUM IONS; ATOMS; CHEMICAL COMPOSITION; EVAPORATION; IMAGES; ION MICROSCOPES; ION MICROSCOPY; MORPHOLOGY; PARTICLES; PROBES; ZIRCONIUM IONS
Descriptors DEC
CHARGED PARTICLES; IONS; MICROSCOPES; MICROSCOPY; PHASE TRANSFORMATIONS

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.