Published 1991 | Version v1
Book

Electrochemical studies of amorphous passive films prepared by ion beam

  • 1. Wuhan University (China). Department of Physics

Description

Alternating Fe,Cr layers were deposited on the glass and the pure iron substrates placed in a target chamber of a 200 KeV implanter. Fe-Cr amorphous films have been formed by ion beam mixing with 150 KeV Ar+, P+ and B+ respectively. The doses were varied from 1.5x1015ions/cm2 to 5x1016ions/cm2. The process of ion bombardment was simulated by TRIM-88 program. Microstructures of the ion-mixed Fe-Cr samples were examined by transmission electron microscope (TEM). The anodic polari-zation curves were obtained by means of a potentiodynamic sweep system. Results show that the corrosion resistance of the amorphous film in 1N H2SO4 solution is considerably increased than that of pure iron. It is found by X-ray photoelectron spectroscopy (XPS) analysis that the in-crease of the corrosion resistance is associated with an ultra-thin Cr-rich surface film, which contains a compound of [CrOx (OH)y·nH2O]. (author). 3 refs.; 4 figs.; 3 tabs

Part of:
C-MRS International 1990 symposia proceedings. V. 4. Thin films and beam-solid interactions

Additional details

Publishing Information

Publisher
North-Holland.
Imprint Place
Amsterdam (Netherlands)
ISBN
0 444 89011 4
Imprint Title
C-MRS International 1990 symposia proceedings. V. 4. Thin films and beam-solid interactions
Imprint Pagination
601 p.
Journal Page Range
p. 469-473.

Conference

Title
thin films, and H: laser and particle-beam interactions with solids of the C-MRS International 1990 Conference.
Acronym
Symposia I
Dates
18-22 Jun 1990.
Place
Beijing (China).

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
22082008
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
AMORPHOUS STATE; ARGON IONS; BORON IONS; CHROMIUM; ION BEAMS; IRON; LAYERS; MICROSTRUCTURE; MIXING; PHOSPHORUS IONS; THIN FILMS
Descriptors DEC
BEAMS; CHARGED PARTICLES; CRYSTAL STRUCTURE; ELEMENTS; FILMS; IONS; METALS; TRANSITION ELEMENTS

Optional Information

Notes
Imprint:C-MRS = Chinese Materials Research Society; Includes author index and subject index.