Published 1997 | Version v1
Book Metadata-only

Multipole analysis of electron density in topaz according to precise X-ray diffraction

Creators

  • 1. Rossijskij Khimiko-Tekhnologicheskij Univ., Moscow (Russian Federation)
  • 2. Moskovskij Gosudarstvennyj Univ., Moscow (Russian Federation)

Description

The investigation of the electron density (ED) in topaz according to X-ray diffraction results is carried out on the basis of the multipole model. Maps of the static multiple deformation ED and the electrostatic potential are obtained. The topological analysis of topaz ED is made. The features of the face-centered packing of topaz are considered in ED terms

Abstract (Russian)

Исследование электронной плотности (ЭП) в топазе по рентгенодифракционным данным выполнена на основе мультипольной модели. Получены карты статической мультипольной деформационной ЭП и электростатического потенциала. Проведен топологический анализ ЭП топаза. Особенности плотностей упаковки топаза рассмотрены с точки зрения ЭП
Part of:
National conference on the application of X-rays, synchrotron radiation, neutrons and electrons for materials study (the continuation of All-Union Meetings on the application of X-rays for materials research). Summary of reports. Volume 1

Additional details

Additional titles

Original title (Russian)
Мультипольный анализ распределения электронной плотности в топазе по результатам прецизионного рентгенодифракционного исследования

Publishing Information

Publisher
OIYaI
Imprint Place
Dubna (Russian Federation)
ISBN
5-85165-480-5
Imprint Title
National conference on the application of X-rays, synchrotron radiation, neutrons and electrons for materials study (the continuation of All-Union Meetings on the application of X-rays for materials research). Summary of reports. Volume 1
Imprint Pagination
363 p.
Journal Page Range
p. 148-153

Conference

Title
National conference on the application of X-rays, synchrotron radiation, neutrons and electrons for materials study (the continuation of All-Union Meetings on the application of X-rays for materials research)
Original Conference Title
Natsional'naya konferentsiya po primeneniyu rentgenovskogo, sinkhrotronnogo izluchenij, nejtronov i ehlektronov dlya issledovaniya materialov (prodolzhenie Vsesoyuznykh soveshchanij po primeneniyu rentgenovskikh luchej dlya issledovaniya materialov)
Dates
25-29 May 1997
Place
Dubna (Russian Federation)

INIS

Country of Publication
Russian Federation
Country of Input or Organization
Russian Federation
INIS RN
33007656
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CRYSTAL FIELD; CRYSTAL STRUCTURE; DATA PROCESSING; DIAGRAMS; ELECTRON DENSITY; ELECTRONIC STRUCTURE; MULTIPOLES; SILICATE MINERALS; STRUCTURAL CHEMICAL ANALYSIS; TOPOLOGY; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; INFORMATION; MATHEMATICS; MINERALS; PROCESSING; SCATTERING

Optional Information

Notes
22 refs., 5 figs. Imprint:Natsional'naya konferentsiya po primeneniyu rentgenovskogo, sinkhrotronnogo izluchenij, nejtronov i ehlektronov dlya issledovaniya materialov (prodolzhenie Vsesoyuznykh soveshchanij po primeneniyu rentgenovskikh luchej dlya issledovaniya materialov). Sbornik dokladov. Tom 1
Secondary number(s)
JINR-R--14-97-343