Published 1960
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A radio-crystallographic apparatus for the examination of irradiated materials
- 1. Commissariat a l'Energie Atomique, Saclay (France).Centre d'Etudes Nucleaires
Description
Description of a radio-crystallographic apparatus designed for the examination of irradiated metals. - The double diffraction method was used: a monochromator is placed in the beam of X-rays diffracted by the sample, thus enabling lead shielding to be interposed between the sample and the counter. In this way a very large proportion of the radiation due to the activity of the sample is eliminated. By this method substances with activities of the order of several tens of curies may be examined, and the relative precision obtained in measurements of parameters with this apparatus is equal to 10-4 in the case of good crystals. (author)
Availability note (English)
Available from INIS in electronic formAbstract (French)
Description d'un appareil de radiocristallographie destine a l'examen de metaux irradies. - Nous avons utilise la methode de double diffraction: un monochromateur est place dans le faisceau de rayons X diffracte par l'echantillon, ce qui permet d'interposer une protection de plomb entre l'echantillon et le compteur. On elimine ainsi dans une tres grande proportion le rayonnement du a la radioactivite de l'echantillon. On peut ainsi examiner des substances d'une activite de l'ordre de quelques dizaines de curies et la precision relative obtenue pour les mesures de parametres avec cet appareil est egale a 10-4 dans le cas de bons cristaux. (auteur)Files
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Additional details
Additional titles
- Original title (French)
- Appareil de radiocristallographie pour examens de materiaux irradies
Publishing Information
- Imprint Pagination
- 24 p.
- Report number
- CEA-R--1449
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 38102024
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- ACCURACY; BEAM OPTICS; BEAM SHAPING; BRAGG REFLECTION; COLLIMATORS; CRYSTALLOGRAPHY; DIFFRACTION METHODS; FOCUSING; GEIGER-MUELLER COUNTERS; LEAD; METALS; MONOCHROMATORS; POST-IRRADIATION EXAMINATION; RECORDING SYSTEMS; SAMPLE HOLDERS; SHIELDING; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELEMENTS; MEASURING INSTRUMENTS; METALS; RADIATION DETECTORS; REFLECTION; SCATTERING
Optional Information
- Notes
- 9 refs.