Published January 2012 | Version v1
Journal article

Effect of ionization distribution on the low frequency oscillations mode in Hall thrusters

  • 1. Harbin Institute of Technology, Mail Box 3047, Harbin (China)

Description

It is found that the discharge parameters have notable effects on the mode of discharge current low frequency oscillation in Hall thrusters, but different discharge parameters might form the similar low frequency oscillation mode. In order to study the mechanism of oscillation mode formation, the ionization distribution in the discharge channel was measured experimentally, and one-dimensional quasi-neutrality hydrodynamic model was used to study the relationship between ionization distribution and the oscillation mode. Researches show that the low frequency oscillation with a narrow and condensed ionization distribution has the mode of lower amplitude and scattered frequency. The low frequency oscillation amplitude would become high and have dominative frequency component with the relative wide ionization distribution. Therefore, it can be concluded that the difference of ionization distribution characteristics is the main reason of the oscillation mode variation, and discharge parameters are only the external control parameters of ionization distribution characteristics.

Additional details

Identifiers

Publishing Information

Journal Title
Physics of Plasmas
Journal Volume
19
Journal Issue
1
Journal Page Range
p. 012107-012107.6
ISSN
1070-664X
CODEN
PHPAEN

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44003000
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Descriptors DEI
AMPLITUDES; DISTRIBUTION; ELECTRIC DISCHARGES; HYDRODYNAMIC MODEL; IONIZATION; MAGNETOHYDRODYNAMICS; OSCILLATION MODES; OSCILLATIONS; PLASMA; PLASMA WAVES; THRUSTERS
Descriptors DEC
FLUID MECHANICS; HYDRODYNAMICS; MATHEMATICAL MODELS; MECHANICS; PARTICLE MODELS; STATISTICAL MODELS; THERMODYNAMIC MODEL

Optional Information

Notes
(c) 2012 American Institute of Physics