Published September 1, 2011 | Version v1
Journal article

Reliability design and assessment of a micro-probe using the results of a tensile test of a beryllium–copper alloy thin film

  • 1. Department of Mechatronics Engineering, College of Engineering, Tongmyong University, 535, Yongdang-Dong, Nam-Gu, Busan 608-711 (Korea, Republic of)
  • 2. Structure Research Team, Jeonbuk Institute of Automotive Technology, 1641-4, Soryong-Dong, Kunsan, Jeonbuk 573-882 (Korea, Republic of)

Description

This paper describes the results of tensile tests for a beryllium–copper (BeCu) alloy thin film and the application of the results to the design of a probe. The copper alloy films were fabricated by electroplating. To obtain the tensile characteristics of the film, the dog-bone type specimen was fabricated by the etching method. The tensile tests were performed with the specimen using a test machine developed by the authors. The BeCu alloy has an elastic modulus of 119 GPa and the 0.2% offset yield and ultimate tensile strengths of 1078 MPa and 1108 MPa, respectively. The design and manufacture of a smaller probe require higher pad density and smaller pad-pitch chips. It should be effective in high-frequency testing. For the design of a new micro-probe, we investigated several design parameters that may cause problems, such as the contact force and life, using the tensile properties and the design of experiment method in conjunction with finite element analysis. The optimal dimensions of the probe were found using the response surface method. The probe with optimal dimensions was manufactured by a precision press process. It was verified that the manufactured probe satisfied the life, the contact force and the over drive through the compression tests and the life tests of the probes

Availability note (English)

Available from http://dx.doi.org/10.1088/0960-1317/21/9/095023

Additional details

Identifiers

DOI
10.1088/0960-1317/21/9/095023;
PII
S0960-1317(11)90556-7;

Publishing Information

Journal Title
Journal of Micromechanics and Microengineering. Structures, Devices and Systems
Journal Volume
21
Journal Issue
9
Journal Page Range
[10 p.]
ISSN
0960-1317
CODEN
JMMIEZ