Reducing beam hardening effects and metal artefacts in spectral CT using Medipix3RX
Creators
- 1. University of Otago, 2 Riccarton Ave, Christchurch 8140 (New Zealand)
- 2. University of Canterbury, Private Bag 4800, Christchurch 8140 (New Zealand)
- 3. MARS Bioimaging Ltd, 29a Clyde Rd, Christchurch (New Zealand)
Description
This paper discusses methods for reducing beam hardening effects and metal artefacts using spectral x-ray information in biomaterial samples. A small-animal spectral scanner was operated in the 15 to 80 keV x-ray energy range for this study. We use the photon-processing features of a CdTe-Medipix3RX ASIC in charge summing mode to reduce beam hardening and associated artefacts. We present spectral data collected for metal alloy samples, its analysis using algebraic 3D reconstruction software and volume visualisation using a custom volume rendering software. The cupping effect and streak artefacts are quantified in the spectral datasets. The results show reduction in beam hardening effects and metal artefacts in the narrow high energy range acquired using the spectroscopic detector. A post-reconstruction comparison between CdTe-Medipix3RX and Si-Medipix3.1 is discussed. The raw data and processed data are made available (http://hdl.handle.net/10092/8851) for testing with other software routines
Availability note (English)
Available from http://dx.doi.org/10.1088/1748-0221/9/03/P03015Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Instrumentation
- Journal Volume
- 9
- Journal Issue
- 03
- Journal Page Range
- p. P03015
- ISSN
- 1748-0221
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46056077
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ALLOYS; BEAMS; CDTE SEMICONDUCTOR DETECTORS; COMPARATIVE EVALUATIONS; DATASETS; KEV RANGE 10-100; METALS; X RADIATION
- Descriptors DEC
- DOCUMENT TYPES; ELECTROMAGNETIC RADIATION; ELEMENTS; ENERGY RANGE; EVALUATION; IONIZING RADIATIONS; KEV RANGE; MEASURING INSTRUMENTS; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS