Published December 17, 2002
| Version v1
Journal article
Rod-pinch diode currents in the magnetically limited regime
Creators
- 1. Institute of High Current Electronics, 4 Akademicheskii Ave., Tomsk, 634055 (Russian Federation)
- 2. High Energy Density Research Investigation Center, Moscow (Russian Federation)
Description
In this work, relations for the Rod-Pinch Diode (RPD) currents, which should hold true for the magnetically limited (ML) regime, have been derived based on the general criterion of magnetic insulation of an electron beam in a cylindrical diode. It has been shown that to appreciate the physics of the processes in question the external currents, which play a leading part in the ML regime, should be distinguished. Simple formulae have been derived, which, given the relation between the currents, make possible prediction of the state of the electron beam in the diode and calculations of the scaling factor α for the critical current
Additional details
Identifiers
- DOI
- 10.1063/1.1530834;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 650
- Journal Issue
- 1
- Journal Page Range
- p. 195-198
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 14. international conference on high-power particle beams
- Acronym
- BEAMS 2002
- Dates
- 23-28 Jun 2002
- Place
- Albuquerque, NM (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36064878
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRITICAL CURRENT; CYLINDRICAL CONFIGURATION; ELECTRON BEAMS; MAGNETIC INSULATION; MAGNETIC SHIELDING; RODS; THERMIONIC DIODES; X-RAY RADIOGRAPHY
- Descriptors DEC
- BEAMS; CONFIGURATION; CURRENTS; DIODE TUBES; ELECTRIC CURRENTS; ELECTRON TUBES; INDUSTRIAL RADIOGRAPHY; LEPTON BEAMS; MATERIALS TESTING; NONDESTRUCTIVE TESTING; PARTICLE BEAMS; SHIELDING; TESTING; THERMIONIC TUBES
Optional Information
- Notes
- (c) 2002 American Institute of Physics