Published August 1, 1978 | Version v1
Journal article

Quantitative study of the transmission of axially channeled protons in thin silicon crystals

  • 1. Rutgers University, New Brunswick, New Jersey 08903

Description

The azimuthal distributions of protons transmitted through thin silicon single crystals near the <110> axis were measured using a two-dimensional position-sensitive detector. The data are composed of ringlike distributions with strong azimuthal and transverse energy dependence. The azimuthal distributions are compared with theoretical predictions based on the random string approximation using different forms of the interatomic potential. ''Blocking'' in the transverse plane is also observed. In addition, from an analysis of the radial spreading of the distribution the effects of inelastic scattering in the transverse plane are clearly seen

Additional details

Publishing Information

Journal Title
Phys. Rev., B
Journal Volume
18
Journal Issue
3
Series
Phys. Rev., B.
Journal Page Range
1066-1075

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
10423213
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ANGULAR DISTRIBUTION; PROTON CHANNELING; RUTHERFORD SCATTERING; SILICON; TRANSVERSE MOMENTUM
Descriptors DEC
CHANNELING; DISTRIBUTION; ELASTIC SCATTERING; ELEMENTS; LINEAR MOMENTUM; SCATTERING; SEMIMETALS