Published August 1, 1978
| Version v1
Journal article
Quantitative study of the transmission of axially channeled protons in thin silicon crystals
- 1. Rutgers University, New Brunswick, New Jersey 08903
Description
The azimuthal distributions of protons transmitted through thin silicon single crystals near the <110> axis were measured using a two-dimensional position-sensitive detector. The data are composed of ringlike distributions with strong azimuthal and transverse energy dependence. The azimuthal distributions are compared with theoretical predictions based on the random string approximation using different forms of the interatomic potential. ''Blocking'' in the transverse plane is also observed. In addition, from an analysis of the radial spreading of the distribution the effects of inelastic scattering in the transverse plane are clearly seen
Additional details
Publishing Information
- Journal Title
- Phys. Rev., B
- Journal Volume
- 18
- Journal Issue
- 3
- Series
- Phys. Rev., B.
- Journal Page Range
- 1066-1075
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 10423213
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANGULAR DISTRIBUTION; PROTON CHANNELING; RUTHERFORD SCATTERING; SILICON; TRANSVERSE MOMENTUM
- Descriptors DEC
- CHANNELING; DISTRIBUTION; ELASTIC SCATTERING; ELEMENTS; LINEAR MOMENTUM; SCATTERING; SEMIMETALS