Precision Fast Ion Beam Laser Spectroscopy of Ar+
Creators
- 1. Department of Physics, Texas A and M University (United States)
- 2. Atomic Physics Laboratory, RIKEN (Japan)
- 3. Graduate School of Arts and Science, University of Tokyo (Japan)
- 4. Japan Atomic Energy Research Institute (Japan)
- 5. Department of Physics, Sophia University (Japan)
Description
Absolute measurements of spectral lines of Ar+ ions using collinear and anticollinear geometries were performed. To provide a precise reference for the laser wavelength, iodine saturation spectroscopy was applied. The precision of this reference is effected by observing the beat node between the spectroscopy laser and the corresponding mode of a femtosecond laser frequency comb. Laser-induced fluorescence allowed to perform precision frequency measurements of an Ar+ transition in collinear and anticollinear geometries simultaneously; then an exact relativistic formula for the absolute transition frequency V0 = √(VcVa) was used. In this geometry the influence of ion source instabilities due to pressure and anode voltage fluctuations was minimized. The result is v0 = 485,573,619.7(3) MHz, which corresponds to Δv/v = 6*10-10. This represents an improvement of two orders of magnitude over the previous NIST published value.
Additional details
Identifiers
- DOI
- 10.1063/1.3115608;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1104
- Journal Issue
- 1
- Journal Page Range
- p. 42-46
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 4. international conference on laser probing
- Acronym
- LAP 2008
- Dates
- 6-10 Oct 2008
- Place
- Nagoya (Japan)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41039401
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCURACY; ARGON IONS; ENERGY-LEVEL TRANSITIONS; FLUCTUATIONS; FLUORESCENCE; FREQUENCY MEASUREMENT; IODINE; ION BEAMS; ION SOURCES; LASER SPECTROSCOPY; MHZ RANGE
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; ELEMENTS; EMISSION; FREQUENCY RANGE; HALOGENS; IONS; LUMINESCENCE; NONMETALS; PHOTON EMISSION; SPECTROSCOPY; VARIATIONS
Optional Information
- Notes
- (c) 2009 American Institute of Physics