Published March 17, 2009 | Version v1
Journal article

Precision Fast Ion Beam Laser Spectroscopy of Ar+

  • 1. Department of Physics, Texas A and M University (United States)
  • 2. Atomic Physics Laboratory, RIKEN (Japan)
  • 3. Graduate School of Arts and Science, University of Tokyo (Japan)
  • 4. Japan Atomic Energy Research Institute (Japan)
  • 5. Department of Physics, Sophia University (Japan)

Description

Absolute measurements of spectral lines of Ar+ ions using collinear and anticollinear geometries were performed. To provide a precise reference for the laser wavelength, iodine saturation spectroscopy was applied. The precision of this reference is effected by observing the beat node between the spectroscopy laser and the corresponding mode of a femtosecond laser frequency comb. Laser-induced fluorescence allowed to perform precision frequency measurements of an Ar+ transition in collinear and anticollinear geometries simultaneously; then an exact relativistic formula for the absolute transition frequency V0 = √(VcVa) was used. In this geometry the influence of ion source instabilities due to pressure and anode voltage fluctuations was minimized. The result is v0 = 485,573,619.7(3) MHz, which corresponds to Δv/v = 6*10-10. This represents an improvement of two orders of magnitude over the previous NIST published value.

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1104
Journal Issue
1
Journal Page Range
p. 42-46
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
4. international conference on laser probing
Acronym
LAP 2008
Dates
6-10 Oct 2008
Place
Nagoya (Japan)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41039401
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCURACY; ARGON IONS; ENERGY-LEVEL TRANSITIONS; FLUCTUATIONS; FLUORESCENCE; FREQUENCY MEASUREMENT; IODINE; ION BEAMS; ION SOURCES; LASER SPECTROSCOPY; MHZ RANGE
Descriptors DEC
BEAMS; CHARGED PARTICLES; ELEMENTS; EMISSION; FREQUENCY RANGE; HALOGENS; IONS; LUMINESCENCE; NONMETALS; PHOTON EMISSION; SPECTROSCOPY; VARIATIONS

Optional Information

Notes
(c) 2009 American Institute of Physics