Published July 1, 2019 | Version v1
Journal article

The effect of ion irradiation (Ar+, E = 10 keV) on the nanocrystalline structure and the aging of the Al-Li-Cu-Zn-Mg-Zr-Sc alloy after megaplastic deformation

  • 1. Institute of Electrophysics, Ural Branch of Russian Academy of Sciences, Amundsena Street 106, Yekaterinburg, 620016 (Russian Federation)
  • 2. Institute of Metal Physics, Ural Branch of Russian Academy of Sciences, St. S. Kovalevskoy 18, Yekaterinburg, 620990 (Russian Federation)

Description

The effect of Ar+ ion irradiation on structural and phase transformations in a 1461 alloy (Al–Li–Cu–Mg) subjected to megaplastic deformationhas has been studied by transmission electron microscopy. Short-term irradiation (E = 10 keV, F = 2 × 1016 cm−2) has been established to form a low-energy recrystallized submicrocrystalline structure at a depth (∼200 μm), significantly exceeding the projective ion ranges (∼10 nm). The study confirms the important role of the radiation-dynamic effect during the ion irradiation of metastable media. The structural and phase transformations take place in the alloy at a depth of much higher than the projective ion ranges and at a higher rate compared with traditional thermal annealing. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/1281/1/012026

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
1281
Journal Issue
1
Journal Page Range
[5 p.]
ISSN
1742-6596

Conference

Title
14. International Conference on Films and Coatings
Dates
14-16 May 2019
Place
Saint Petersburg (Russian Federation)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
53043348
Subject category
S36: MATERIALS SCIENCE; S77: NANOSCIENCE AND NANOTECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALLOYS; ARGON IONS; CRYSTALS; IRRADIATION; KEV RANGE; NANOSTRUCTURES; PHASE TRANSFORMATIONS; SULFUR IONS; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
CHARGED PARTICLES; ELECTRON MICROSCOPY; ENERGY RANGE; IONS; MICROSCOPY