Published May 1994
| Version v1
Report
Low level environmental measurements by gamma spectroscopy
Creators
- 1. CEA Centre d'Etudes de Fontenay-aux-Roses, 92 (France)
Description
An automatic sample changer for low level environmental measurement is here described. All individual components including detector assembly, liquid nitrogen cryostat and shielding chamber are made from carefully selected materials. The 225 cm3 U-type Ge detector is attached to a 20 l Dewar. The 150 mm thick lead shield prevents background counts due to external sources. A 8 mm copper graded liner at the inside of the shielding chamber prevents interference by lead X-rays. This measurement system reduces dramatically counting time and improves lower limits of detection. (authors). 2 figs., 4 ills., 2 refs
Additional details
Additional titles
- Original title (French)
- Mesures a faible niveau d'activite en spectrometrie gamma
Publishing Information
- Imprint Title
- Gamma and X 93 spectrometry
- Imprint Pagination
- 422 p.
- Journal Page Range
- p. 337-339.
- Report number
- CEA-N--2756
Conference
- Title
- Meetings of Gamma and X 93 Spectrometry.
- Original Conference Title
- Journees de Spectrometrie Gamma et X 93
- Dates
- 12-14 Oct 1993.
- Place
- Saint-Remy-les-Chevreuse (France).
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 26037998
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACTIVITY LEVELS; BACKGROUND NOISE; BACKGROUND RADIATION; COSMIC GAMMA SOURCES; COSMIC RADIATION; CRYOSTATS; DATA ACQUISITION SYSTEMS; ENVIRONMENTAL QUALITY; EXTERNAL IRRADIATION; GAMMA DETECTION; GAMMA SOURCES; GAMMA SPECTROSCOPY; HIGH-PURITY GE DETECTORS; LEAD; LOW LEVEL COUNTERS; LOW LEVEL COUNTING; RADIATION MONITORING; RADIATION PROTECTION; SAMPLE CHANGERS; SAMPLE HOLDERS; SHIELDING; SHIELDING MATERIALS
- Descriptors DEC
- CONTROL EQUIPMENT; COSMIC RAY SOURCES; COUNTING TECHNIQUES; DETECTION; ELEMENTS; EQUIPMENT; GE SEMICONDUCTOR DETECTORS; IONIZING RADIATIONS; IRRADIATION; MATERIALS; MEASURING INSTRUMENTS; METALS; MONITORING; NOISE; RADIATION DETECTION; RADIATION DETECTORS; RADIATION SOURCES; RADIATIONS; SEMICONDUCTOR DETECTORS; SPECTROSCOPY; THERMOSTATS
Optional Information
- Notes
- Imprint:Spectrometrie gamma et X 93.