Published November 1975 | Version v1
Report Open

Enhancement factor of the electric field in the point-plane configuration

Description

In many dielectric tests a point and plane set of electrodes is used. The point may be tungsten and can be ground accurately to a cone of specified half angle. By grinding and etching the tip may be finished to a spherical shape. The radius may be determined by optical magnification. Given the cone half angle, the tip radius and the gap, it is of interest to find the enhancement factor, i.e., the ratio of the electric field at the tip to the average electric field within the gap. A modification of a technique is outlined, that permits the determination of the enhancement factor by computer for any practical cone angle and radius and for gap lengths of 1 cm and less

Availability note (English)

MF available from INIS under the Report Number.

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Additional details

Publishing Information

Imprint Pagination
19 p.
Report number
ORNL-TM--5137

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
7234979
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Descriptors DEI
COMPUTER CALCULATIONS; DIELECTRIC MATERIALS; ELECTRIC CHARGES; ELECTRIC FIELDS; ELECTRODES; SPHERICAL CONFIGURATION
Descriptors DEC
CONFIGURATION