Published November 1975
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Enhancement factor of the electric field in the point-plane configuration
Description
In many dielectric tests a point and plane set of electrodes is used. The point may be tungsten and can be ground accurately to a cone of specified half angle. By grinding and etching the tip may be finished to a spherical shape. The radius may be determined by optical magnification. Given the cone half angle, the tip radius and the gap, it is of interest to find the enhancement factor, i.e., the ratio of the electric field at the tip to the average electric field within the gap. A modification of a technique is outlined, that permits the determination of the enhancement factor by computer for any practical cone angle and radius and for gap lengths of 1 cm and less
Availability note (English)
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Additional details
Publishing Information
- Imprint Pagination
- 19 p.
- Report number
- ORNL-TM--5137
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 7234979
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- COMPUTER CALCULATIONS; DIELECTRIC MATERIALS; ELECTRIC CHARGES; ELECTRIC FIELDS; ELECTRODES; SPHERICAL CONFIGURATION
- Descriptors DEC
- CONFIGURATION