Published November 2014 | Version v1
Journal article Metadata-only

Distorted and undistorted atomic sites in a ferromagnetic semiconductor Ge0.6Mn0.4Te film determined by x-ray fluorescence holography

Creators

  • 1. Hiroshima City University, Graduate School of Information Sciences, Hiroshima (Japan)
  • 2. Tohoku University, Institute for Materials Research, Sendai, Miyagi (Japan)
  • 3. Ube National College of Technology, Department of Electrical Engineering, Ube, Yamaguchi (Japan)
  • 4. Hiroshima University, Hiroshima Synchrotron Radiation Center, Higashi-Hiroshima, Hiroshima (Japan)
  • 5. Japan Synchrotron Radiation Research Institute (JASRI/SPring-8), Research and Utilization Division, Sayo, Hyogo (Japan)
  • 6. Kumamoto University, Graduate School of Science and Technology, Kumamoto (Japan)

Description

Local atomic structures around Ge and Mn atoms in a ferromagnetic semiconductor Ge0.6Mn0.4Te thin film were investigated by performing Ge and Mn Kα X-ray fluorescence holographic experiments. The obtained three-dimensional atomic images revealed that the local structure around Mn formed a rock salt lattice, whereas the lattice around Ge was strongly distorted, which is reflected by a rhombohedral structure of GeTe. The undistorted rock salt environment around the Mn atoms is considered to be a key factor allowing for this alloy to exhibit high-temperature ferromagnetism. (author)

Additional details

Publishing Information

Journal Title
Journal of the Physical Society of Japan
Journal Volume
83
Journal Issue
11
Journal Page Range
p. 113601.1-113601.4
ISSN
0031-9015

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
46028784
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ANTIFERROMAGNETISM; FERROMAGNETIC MATERIALS; FERROMAGNETISM; FLUCTUATIONS; GERMANIUM TELLURIDES; HOLOGRAPHY; KEK PHOTON FACTORY; MAGNETIC SEMICONDUCTORS; MANGANESE COMPOUNDS; THIN FILMS; X-RAY DIFFRACTION; X-RAY FLUORESCENCE ANALYSIS
Descriptors DEC
CHALCOGENIDES; CHEMICAL ANALYSIS; COHERENT SCATTERING; DIFFRACTION; FILMS; GERMANIUM COMPOUNDS; MAGNETIC MATERIALS; MAGNETISM; MATERIALS; NONDESTRUCTIVE ANALYSIS; RADIATION SOURCES; SCATTERING; SEMICONDUCTOR MATERIALS; SYNCHROTRON RADIATION SOURCES; TELLURIDES; TELLURIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; VARIATIONS; X-RAY EMISSION ANALYSIS

Optional Information

Notes
25 refs., 3 figs.