Published May 1979
| Version v1
Journal article
Luminescence measurements of silica glass - a contribution to the order and structure of X-ray amorphous SiO2
Creators
- 1. Zentralinstitut fuer Kernforschung, Rossendorf bei Dresden (German Democratic Republic)
Description
Samples of silica glass were X-irradiated with 200 Gy and the induced luminescence was measured. Luminescence could not be induced in silica glass produced from SiCl4 or organic silicon compounds. Silica glass annealed at temperatures above 1100 0C or prepared from pure quartz was found to be luminescent. Intensity and half-life of the luminescence were dependent on the degree of inhomogeneity and on the preparation of the glass samples. Quartz crystal showed the maximal luminescence with regard to the half-life
Additional details
Additional titles
- Original title (German)
- Lumineszenzmessungen an Kieselglass - ein Beitrag zur Ordnung und Struktur von roentgenamorphem SiO
Publishing Information
- Journal Title
- Z. Chem.
- Journal Volume
- 19
- Journal Issue
- 5
- Series
- Z. Chem.
- Journal Page Range
- 184-186
- ISSN
- 0044-2402
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- German Democratic Republic
- INIS RN
- 10486573
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- AMORPHOUS STATE; GLASS; HARD X RADIATION; ORDER PARAMETERS; QUARTZ; RADIOLUMINESCENCE
- Descriptors DEC
- CHALCOGENIDES; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; LUMINESCENCE; OXIDES; OXYGEN COMPOUNDS; RADIATIONS; SILICON COMPOUNDS; SILICON OXIDES; X RADIATION