Published 2019
| Version v1
Miscellaneous
Proof-of-principle experiment of slow beam extraction from a synchrotron using a radio frequency knockout system with a broadband
- 1. Nihon University, College of Industrial Technology, Narashino, Chiba (Japan)
- 2. Wakasa Wan Energy Research Center (WERC), Tsuruga, Fukui (Japan)
Description
A simulation study on an RFKO beam extraction has shown that the spill with the CN including many bands around the betatron resonances is clearly more uniform than that with the CN by one band. In order to realize this method, a prototype of the RF-knockout system with a frequency band of 1-14 MHz is developed for a proof-of-principle experiment at the WERC synchrotron. The beam experiment shows that a uniformity of spill intensity improves with the number of frequency band as predicted in the beam simulation. The standard deviation of spill fluctuation to the average value with ten bands becomes 57% of that with one band. (author)
Availability note (English)
Available from https://www.pasj.jp/web_publish/pasj2019/proceedings/PDF/WEOI/WEOI07.pdfAdditional details
Additional titles
- Original title (Japanese)
- マルチバンドRFKO電界による遅いビーム取り出しの原理実証実験
Identifiers
Publishing Information
- Imprint Title
- Proceedings of the 16th annual meeting of Particle Accelerator Society of Japan
- Imprint Pagination
- [1296 p.]
- Journal Page Range
- p. 66-69
Conference
- Title
- 16. annual meeting of Particle Accelerator Society of Japan
- Acronym
- PASJ2019
- Dates
- 31 Jul - 3 Aug 2019
- Place
- Kyoto (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 51044402
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- BEAM EXTRACTION; BEAM MONITORS; BETATRONS; CAPACITANCE; DIGITAL FILTERS; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTRODES; FREQUENCY SELECTION; RF SYSTEMS; SEPTUM MAGNETS; SIMULATION; SYNCHROTRONS
- Descriptors DEC
- ACCELERATORS; CURRENTS; CYCLIC ACCELERATORS; ELECTRICAL PROPERTIES; EQUIPMENT; MAGNETS; MEASURING INSTRUMENTS; MONITORS; PHYSICAL PROPERTIES; TUNING
Optional Information
- Notes
- 6 refs., 13 figs. Imprint:#7B2C#16#56DE# #65E5##672C##52A0##901F##5668##5B66##4F1A##5E74##4F1A#