Published 2019 | Version v1
Miscellaneous

Proof-of-principle experiment of slow beam extraction from a synchrotron using a radio frequency knockout system with a broadband

  • 1. Nihon University, College of Industrial Technology, Narashino, Chiba (Japan)
  • 2. Wakasa Wan Energy Research Center (WERC), Tsuruga, Fukui (Japan)

Description

A simulation study on an RFKO beam extraction has shown that the spill with the CN including many bands around the betatron resonances is clearly more uniform than that with the CN by one band. In order to realize this method, a prototype of the RF-knockout system with a frequency band of 1-14 MHz is developed for a proof-of-principle experiment at the WERC synchrotron. The beam experiment shows that a uniformity of spill intensity improves with the number of frequency band as predicted in the beam simulation. The standard deviation of spill fluctuation to the average value with ten bands becomes 57% of that with one band. (author)

Availability note (English)

Available from https://www.pasj.jp/web_publish/pasj2019/proceedings/PDF/WEOI/WEOI07.pdf
Part of:
Proceedings of the 16th annual meeting of Particle Accelerator Society of Japan

Additional details

Additional titles

Original title (Japanese)
マルチバンドRFKO電界による遅いビーム取り出しの原理実証実験

Publishing Information

Imprint Title
Proceedings of the 16th annual meeting of Particle Accelerator Society of Japan
Imprint Pagination
[1296 p.]
Journal Page Range
p. 66-69

Conference

Title
16. annual meeting of Particle Accelerator Society of Japan
Acronym
PASJ2019
Dates
31 Jul - 3 Aug 2019
Place
Kyoto (Japan)

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
51044402
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
BEAM EXTRACTION; BEAM MONITORS; BETATRONS; CAPACITANCE; DIGITAL FILTERS; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTRODES; FREQUENCY SELECTION; RF SYSTEMS; SEPTUM MAGNETS; SIMULATION; SYNCHROTRONS
Descriptors DEC
ACCELERATORS; CURRENTS; CYCLIC ACCELERATORS; ELECTRICAL PROPERTIES; EQUIPMENT; MAGNETS; MEASURING INSTRUMENTS; MONITORS; PHYSICAL PROPERTIES; TUNING

Optional Information

Notes
6 refs., 13 figs. Imprint:#7B2C#16#56DE# #65E5##672C##52A0##901F##5668##5B66##4F1A##5E74##4F1A#