Preparation of highly (001)-oriented photoactive tungsten diselenide (WSe2) films by an amorphous solid-liquid-crystalline solid (aSLcS) rapid-crystallization process
- 1. Helmholtz-Zentrum Berlin fuer Materialien und Energie, Institute for Solar Fuels, Hahn-Meitner-Platz 1, 14109, Berlin (Germany)
Description
Highly (001)-textured tungsten diselenide WSe2 thin films have been prepared by a two-step process on quartz glass and TiN metallic back contacts, respectively. At first, X-ray amorphous, selenium-rich WSe2+x films were deposited by reactive magnetron sputtering at room temperature onto a thin metal promoter film (Ni or Pd) and afterwards annealed in an H2Se/Ar atmosphere. X-ray diffraction and scanning electron microscopy show that highly (001)-oriented WSe2 films can be grown, which is caused by the formation of liquid promoter-metal selenide droplets which dissolve tungsten or tungsten selenide at temperatures, higher than the eutectic temperature in the promoter metal-selenium system, followed by oversaturation and eventually crystallization of WSe2 platelets. Time-resolved microwave conductivity measurements show that the films are photoactive. The sum of the carrier mobilities of the best films μe + μh is in the range of 1-7 cm2 V-1 s-1. (copyright 2014 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim)
Availability note (English)
Available from: http://dx.doi.org/10.1002/pssa.201400016Additional details
Identifiers
Publishing Information
- Journal Title
- Physica Status Solidi. A, Applications and Materials Science
- Journal Volume
- 211
- Journal Issue
- 9
- Journal Page Range
- p. 2013-2019
- ISSN
- 1862-6300
- CODEN
- PSSABA
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 45105679
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION SPECTRA; AMORPHOUS STATE; ANNEALING; CARRIER MOBILITY; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; ELECTRIC CONTACTS; GRAIN ORIENTATION; MICROWAVE SPECTRA; SCANNING ELECTRON MICROSCOPY; SOLUBILITY; SPUTTERING; TEMPERATURE RANGE 0400-1000 K; TEXTURE; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; TUNGSTEN SELENIDES; VAPOR DEPOSITED COATINGS; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COATINGS; COHERENT SCATTERING; DIFFRACTION; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; EQUIPMENT; FILMS; HEAT TREATMENTS; MICROSCOPY; MICROSTRUCTURE; MOBILITY; ORIENTATION; PHASE TRANSFORMATIONS; PHYSICAL PROPERTIES; REFRACTORY METAL COMPOUNDS; SCATTERING; SELENIDES; SELENIUM COMPOUNDS; SPECTRA; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS; TUNGSTEN COMPOUNDS