Published October 2004 | Version v1
Journal article Metadata-only

Simulating study on systematic errors in measurements of high-current ion beam emittance with slit-wire method

Creators

  • 1. Institute of Heavy Ion Physics, Beijing Univ. and Key Laboratory of Heavy Ion Physics, Ministry of Education, Beijing (China)

Description

The main sources of systematic errors in measurements of high-current ion beam emittance with slit-wire method are discussed. The errors with different sources were estimated by simulating the measuring process. For the measurements of rms emittance, the systematic errors due to sampling by slits, omitting the slit width and wire diameter as well as the space charge effect can be omitted. But the limitation of slit length and selecting a large threshold can cause significant systematic errors. (authors)

Additional details

Publishing Information

Journal Title
Nuclear Techniques
Journal Volume
27
Journal Issue
10
Journal Page Range
p. 744-748
ISSN
0253-3219

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
37089389
Subject category
S43: PARTICLE ACCELERATORS;
Descriptors DEI
BEAM EMITTANCE; ERRORS; ION BEAMS; MEASURING METHODS; SAMPLING; SIMULATION; SYSTEMS ANALYSIS; WIRES
Descriptors DEC
BEAMS

Optional Information

Notes
4 figs., 4 tabs., 8 refs.